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Displaying 53451 - 53475 of 74189

Size Dependent Electronic Level Structure of Narrow Gap Semiconductor Nanocrystals: InAs Quantum Dots

January 1, 1998

Author(s)

U Banin, J C. Lee, A A. Guzelian, A V. Kadavanich, A P. Alivisatos, W Jaskolski, Garnett W. Bryant, A L. Efros, M Rosen

Small angle scattering by dislocations:

January 1, 1998

Author(s)

Robb Emeritus Thomson, L E Levine, G G Long

Small Angle Scattering Studies of Dendrimer Blends and Interpenetrating Polymer Networks

January 1, 1998

Author(s)

Barry J. Bauer, A Topp, T J. Prosa, Da-Wei Liu, C L. Jackson, Eric J. Amis

This report gives an overview about the first results of an investigation of mixtures that consist of dendrimers and conventional polymers. Poly[amido amine] PAMAM] or poly[propylene amine] [PPI] dendrimers were blended with linear polymers that contain

Software testing by statistical methods::preliminary success estimates for approaches based on binomial models, coverage designs, mutation testing, and usage models

January 1, 1998

Author(s)

David Banks, William Dashiell, Leonard Gallagher, Charles Hagwood, Raghu Kacker, Lynne Rosenthal

Soliton Dynamics in the Collisions of Bose-Einstein Condensates: An Analog of the Josephson Effect

January 1, 1998

Author(s)

W P. Reinhardt, Charles W. Clark

The usual mean-field description of trapped atomic Bose-Einstein condensates predicts the existence of solitons in one-dimensional and quasi-one dimensional confinement. If the net atomic pair interaction is attractive, these solitons appear as coherently

Solute trapping and solute drag in phase-field model of rapid solidification:

January 1, 1998

Author(s)

N A Ahmad, A A Wheeler, W J Boettinger, G B McFadden

Some Properties and Uses of Torsional Overlap Integrals

January 1, 1998

Author(s)

M A. Mekhtiev, Jon T. Hougen

Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) validation procedures::part of United States Geological Survey recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) certification system

January 1, 1998

Author(s)

William H Dashiell, L Arnold Johnson, Lynne S Rosenthal

Spatial Uniformity in Chamber-Cleaning Plasmas Measured Using Planar Laser-Induced Fluorescence

January 1, 1998

Author(s)

Kristen L. Steffens, Mark A. Sobolewski

Planar laser-induced fluorescence (PLIF) measurements were made to determine 2-D spatial maps of CF 2 density as an indicatior of chemical uniformity in 92% CF 4square root of O 2 and 50% C 2F 6 square root of O 2 chamber cleaning plasmas. Measurements

Spatial Uniformity of Responsivity for Silicon, Gallium Nitride, Germanium, and Indium Gallium Arsenide Photodiodes

January 1, 1998

Author(s)

Thomas C. Larason, Sally S. Bruce

For almost a decade, The National Institute of Standards and Technology [NIST] has supplied to its customers calibrated photodiode standards and special tests of photodetectors for absolute spectral response from 200 nm to 1800 nm. During this time spatial