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Displaying 51976 - 52000 of 73697

Atomic Hydrogen for the Formation of Abrupt Sb Doping Profiles in MBE-Grown Si

May 1, 1998
Author(s)
P E. Thompson, C Silvestre, M E. Twigg, G Jernigan, David S. Simons
Previously atomic hydrogen has been shown to be effective in reducing the segregation of Ge on Si[100] during solid source molecular beam epitaxygrowth. In this work we have investigated atomic hydrogen to determine if it is equally effective in reducing

Auditory Nerve Fiber Modeling: A Stochastic Melnikov Approach.

May 1, 1998
Author(s)
Marek Franaszek, Emil Simiu
Well-known experiments have established two basic features of auditory nerve fiber dynamics. First, harmonic excitation with constant amplitude produces mean firing rates that are largest for excitation frequencies contained in a relatively narrow best

Characterization of Broad-Band Transmission for Coplanar Waveguides on CMOS Silicon Substrates

May 1, 1998
Author(s)
V. Milanovic, Mehmet Ozgur, Donald C. DeGroot, Jeffrey Jargon, Michael Gaitan, Mona E. Zaghloul
This paper presents characteristics of microwave transmission in coplanar waveguides (CPW's) on silicon (Si) substrates fabricated through commercial CMOS foundries. Due to the CMOS fabrication, the metal strips of the CPW are encapsulated in thin films of

Characterization of Fracture Origins in Advanced Ceramic Materials

May 1, 1998
Author(s)
George D. Quinn, J Swab, E F. Begley
This NIST web site will complement ASTM standard C1322-96, Standard Practice for Fractography and Characterization of Fracture Origins in Advanced Ceramics. The objectives of the web site are to prove a thumbnail sketch of the standard, promote its usage

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998
Author(s)
T. M. Souders
The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes of successive approximation A/D converters have a spiked distribution, and its variance is half

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998
Author(s)
T. M. Souders
The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes of successive approximation A/D converters have a spiked distribution, and its variance is half

Connection Model for the Seismic Analysis of Welded Steel Moment Frames.

May 1, 1998
Author(s)
John L. Gross
An analytical approach is described for performing seismic evaluation of welded steel moment frame buildings constructed prior to the 1994 Northridge earthquake. The approach is based on an analytical model that captures the possibility of connection

Criteria for United States Geological Survey (USGS) Recognizing Testing Laboratory/ies Functions and Requirements Part of United States Geological Survey Recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Certification

May 1, 1998
Author(s)
W H. Dashiell, L A. Johnson, Lynne S. Rosenthal
This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector Certification Issuing Organizations which provide conformance assessment for the SDTS/TV standard.

Cure, Shrinkage and Properties of an Epoxy Material

May 1, 1998
Author(s)
O Sindt, S L. Simon, G B. McKenna, E Liang
This work focuses on obtaining data to perform realistic finite element models of residual stresses in composite parts made of toughened epoxy thermosets. The initial thrust of the work is aimed at studying the volumetric behavior before, during, and after

Determination of the Seebeck Coefficient of Thin-Film Thermocouples

May 1, 1998
Author(s)
Kenneth G. Kreider, Dean C. Ripple, D P. DeWitt
Thin-film thermocouples have been found useful in numerous applications ranging from thermal convertors, heat flux gages, and thermopiles to surface temperature sensors for turbine engine blades and diesel engine cylinders. Because of their small size

Electrical Linewidth Test Structures Fabricated in Mono-Crystalline Films for Reference-Material Applications

May 1, 1998
Author(s)
Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Rathindra Ghoshtagore, Loren W. Linholm, J. J. Sniegowski
The physical widths of reference features incorporated into electrical linewidth test structures patterned in films of mono-crystalline silicon have been determined from Kelvin voltage measurements. The films in which the test structures are patterned are
Displaying 51976 - 52000 of 73697
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