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Displaying 51001 - 51025 of 73994

Materials Reliability 1998 Programs and Accomplishments

January 1, 1999
Author(s)
H I. McHenry, Thomas A. Siewert
The Materials Reliability Division develops measurement technologies which enable the producers and users of materials to improve the quality and reliability of their products. Measurement technologies are developed for process control to improve the

Mean-Field Theories, Their Weaknesses and Strength

January 1, 1999
Author(s)
Johanna Levelt Sengers
Within a historical context, an evaluation of mean-field theory is given in its application to fluids and fluid mixtures. The way mean-field equations such as the Van der Waals equation incorporate molecular attraction and repulsion implies neglect of

Measurement of the 100 nm NIST SRM 1963 by Differential Mobility Analysis

January 1, 1999
Author(s)
George W. Mulholland, Nelson P. Bryner, C M. Croarkin
The number mean diameter of 100 nm NTST Standard Reference Material (SRM) 1963 was measured to be 100.7 nm with an expanded uncertainty at the 95% confidence level of 1.0 nm by measurement with the differential mobility analyzer (DMA). The low level of

Measurement of the Response of a Gallium Metal Solar Neutrino Experiment to Neutrinos from a 51 Cr Neutrino Source

January 1, 1999
Author(s)
J N. Abdurashitov, V N. Gavrin, S V. Girin, V V. Gorbachev, T V. Ibragimova, A V. Kalikhov, N G. Khairnasov, T V. Knodel, V N. Kornoukhov, I N. Mirmov, A A. Shikhin, E P. Verentenkin, V M. Vermul, V E. Yants, G T. Zatsepin, Yu S. Khomyakov, A V. Zvonarev, T J. Bowles, Jeffrey S. Nico, W A. Teasdale, D L. Wark, M L. Cherry, V N. Karaulov, V L. Levitin, P I. Maev, P I. Nazarenko, V S. Shkol'nik, N V. Skorikov, B T. Cleveland, T Daily, R. Davis, K Lande, C K. Lee, P S. Wildenhain, S R. Elliott, J F. Wilkerson

Measurement Uncertainty and Noise in Nanometrology

January 1, 1999
Author(s)
James E. Potzick
The measurement of feature sizes on integrated circuit photomasks and wafers is an economically important and technically challenging application of nanometrology. The displacement measuring laser heterodyne interferometer is a popular tool in such

Measurement Uncertainty and Uncorrected Bias

January 1, 1999
Author(s)
Steven D. Phillips, K Eberhardt, William T. Estler
This paper discusses the distinction between measurement uncertainty, measurement errors and their role in the calibration process. The issue of including uncorrected bias is addressed and a method to extend the current ISO Guide to the Expression of

Measuring the Geometric Errors of a Hexapod Machine Tool

January 1, 1999
Author(s)
Johannes A. Soons
This paper describes procedures to measure the geometric errors of parallel kinematic machines with a Gough configuration. The procedures are applied to estimate and compensate the errors of a prototype hexapod milling machine.

Metallurgy: 1998 Programs and Accomplishments

January 1, 1999
Author(s)
C A. Handwerker, Robert J. Schaefer
The activities of the NIST Metallurgy Division during FY 1998 are described. The Division's activities are organized into four major programs and two smaller ones, and highlights from each program are presented. The report includes descriptions of the

Microstructural Characterization for Polymer Composites

January 1, 1999
Author(s)
Richard~undefined~undefined~undefined~undefined~undefined Parnas, Donald L. Hunston, Joy Dunkers, Gale A. Holmes
Characterization of composite microstructure is a crucial area since such features plays a major role in processability, performance, damage tolerance, and service life. Moreover, as the reinforcement geometries available are becoming more complex, the

Microwave Network Analyzers - A Discussion of Verification Methods

January 1, 1999
Author(s)
Ronald A. Ginley
Verification of Vector Network Analyzers (VNAs) is very important to the measurement process as well as to establish confidence in the uncertainty of the system. This paper presents a basic discussion about VNA verification including what verification is
Displaying 51001 - 51025 of 73994
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