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Search Publications

NIST Authors in Bold

Displaying 49376 - 49400 of 73697

Calibration Particles Relevant to the Measurement of Nanosize Particles.

October 11, 1999
Author(s)
George W. Mulholland
The development of technologies associated with nanometer size particles, such as automated wafer inspection systems, requires several monosize calibration particlcs with diameters in the range from 1 nm to 100 nm. The one relevant calibration standard

Surface-Fitting Modeling of Images: Theory and Applications

October 8, 1999
Author(s)
Anastase Nakassis, Abdou S. Youssef
Image processing is a very active area with many applications. Many tasks in image processing are highly complicated, and the quality of the software and hardware systems that perform those tasks has proved to be very difficult to measure. One useful

Measurement and Certification in Information Technology

October 7, 1999
Author(s)
D Wallace
Achieving software certification may seem an unreasonable goal. When it comes to determining whether a software product is dependable, safe, and effective, consumers of many types of software are largely on their own. Yet, today's methods provide many

On Performance Statistics for Biometric Systems

October 5, 1999
Author(s)
P J. Phillips
The major contribution of this paper is a duality between the identification and verification evaluation protocols. The duality (1) gives a mapping between identification and verification scores and (2) bounds identification and verification scores in

Combustion Models for Wooden Brands.

October 4, 1999
Author(s)
J P. Woycheese, P J. Pagni
Eight combustion models for burning brands are reviewed. An averaged stagnation-point burning model, using the chemical properties of wood, is used here. Maximum propagation distances are calculated for disk-shaped brands lofted in large fires, such as

Mobile Streams: A Middleware for Reconfigurable Distributed Scripting

October 4, 1999
Author(s)
Mudumbai Ranganathan, V Schaal, V Galtier, Douglas C. Montgomery
A large class of distributed applications follow the event-driven or reactive paradigm. Such applications can benefit from Mobile Agent technology by making it easy to add re-configurability, extensibility, and failure resilience features at an application

Characteristics and Utilization of a New Class of Low On-Resistance MOS-Gated Power Device

October 3, 1999
Author(s)
Jih-Sheng Lai, David W. Berning, Allen R. Hefner Jr., Chien-Chung Shen, B M. Song, R Zhou
A new class of MOS-gated power semiconductor devices Cool MOS has recently been introduced with a supreme conducting characteristic that overcomes the high on-state resistance limitations of the high-voltage power MOSFETs. From the application point of

Colorimetric Accuracies and Concerns in Spectroradiometry of LEDs

October 2, 1999
Author(s)
C Jones, Yoshi Ohno
LEDs are narrow-band emission sources and present special problems in colorimetric characterization. Chromaticity space is mapped using Gaussian spectral models to represent narrow-band emission sources. The Gaussian maps show that the spectral regions are

1999 ITL Technical Accomplishments

October 1, 1999
Author(s)
Elizabeth B. Lennon, K K. Simon
The 1999 ITL Technical Accomplishments report presents the achievements and highlights of NIST's Information Technology Laboratory during FY 1999. Technical projects in eight divisions are described, followed by industry interactions, international

A new model for tensile creep of silicon nitride

October 1, 1999
Author(s)
William E. Luecke, Sheldon M. Wiederhorn
The tensile creep rate of most commercial grades of Si3N4 increases strongly with stress. Although the usual power-law functions can represent the creep data, the data often show curvature and systematic variations of slope with temperature and stress. In

A Thermodynamic Assessment of the Ni-Al-B System

October 1, 1999
Author(s)
Carelyn E. Campbell, Ursula R. Kattner
The thermodynamics of the Ni-Al-B system are assessed based on available literature data. The ternary assessment included the revision of the Al-B binary description to account for the recent experimental work on the melting properties of AlB 12. The Ni-Al

Absolute Distance Interferometry with a 670-nm External Cavity Diode Laser

October 1, 1999
Author(s)
Jack A. Stone Jr., Alois Stejskal, Lowell P. Howard
Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of our

Absolute Interferometry With a 670 nm External Cavity Diode Laser

October 1, 1999
Author(s)
Jack A. Stone Jr., Alois Stejskal, Lowell P. Howard
In the last few years there has been much interest in the use of tunable diode lasers for absolute interferometry. Here we report on the use of an external cavity diode laser operating in the visible (λ{approximately} 670 nm) for absolute distance

Air-Java: Networking for Smart Spaces

October 1, 1999
Author(s)
Kevin L. Mills
Increasingly people work and live on the move. To support this mobile lifestyle, especially as work becomes more intensely information-based, companies are producing various portable and embedded information devices. Concurrently, some interesting pico

An Improved Empirical Correlation for the Thermal Conductivity of Propane

October 1, 1999
Author(s)
M L. Ramires, Carlos A. Nieto de Castro, Richard A. Perkins
New experimental data on the thermal conductivity of propane have been reported since the wide-range correlations proposed by Holland et al. And by Younglove and Ely. These new experimental data, covering a temperature range of 110 to 700 K and a pressure
Displaying 49376 - 49400 of 73697
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