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Displaying 49251 - 49275 of 74175

Preserving the Miracle

January 1, 2000
Author(s)
W G. Leight
This article discusses how standards are developed; the roles played by the private sector and by government, including mandates of the National Technology Transfer and Advancement Act; conformity assessment; and the need for active participation by all

Proceedings of a NIST Internal Workshop on Non-Contact Thermometry

January 1, 2000
Author(s)
Howard H. Harary
This report collects the executive summaries and visual of twenty-two presentations from an internal workshop on non-contract thermometry at NIST. The workshop took place on April 14, 2000, at NIST in Gaithersburg, Maryland, and was video-conferenced to

Progress on PARCS

January 1, 2000
Author(s)
Thomas P. Heavner, Leo W. Hollberg, Steven R. Jefferts, D Meekhof, Thomas E. Parker, William D. Phillips, S L. Rolston, Hugh Robinson, Donald Sullivan, F L. Walls, Neil Ashby, W Klipstein, L Maleki, D Seidel, R Q. Thompson, S Wu, L Young, R Vessot, E Mattison, A Demarchi

Progress Towards Magnetic Trapping of Ultra-cold Neutrons

January 1, 2000
Author(s)
P R. Huffman, C R. Brome, J S. Butterworth, K Coakley, Maynard S. Dewey, S N. Dzhosyuk, David M. Gilliam, R G. Golub, G L. Greene, K Habicht, G L. Jones, Steve K. Lamoreaux, C E. Mattoni, D N. McKinsey, Fred E. Wietfeldt, John M. Doyle

Quantitative Electron Probe Microanalysis of Rough, Bulk Samples

January 1, 2000
Author(s)
Dale E. Newbury
Surface roughness degrades the accuracy of quantitative electron probe x-ray microanalysis through the action of geometric effects on x-ray production and absorption. Measurements of rough surfaces produced on NIST microhomogeneous SRMs will be used to

Radiometry and Photometry: Review for Vision Optics

January 1, 2000
Author(s)
Yoshihiro Ohno
Radiometry is the measurement of optical radiation, which is electromagnetic radiation in the frequency range between 3 x 10 11 Hz and 3 x 10 16 Hz. This range corresponds to wavelengths between 10 nm and 1000 m, and includes the regions commonly called

Raman Intensity Calibration With Glass Luminescence Standards

January 1, 2000
Author(s)
E S. Etz, Wilbur S. Hurst, Steven J. Choquette
This Paper describes the NIST development of standards and procedures for the calibration of the Raman Spectral Intensity. The work is based on the NIST proposal of the use of luminescent glass standards for the transfer of the white light calibration to
Displaying 49251 - 49275 of 74175
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