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Displaying 49201 - 49225 of 73832

Determination of the Scattering Lengths of 39 K from 1 u Photoassociation Lineshapes

December 1, 1999
Author(s)
Carl J. Williams, Eite Tiesinga, Paul S. Julienne, H Wang, W C. Stwalley, P L. Gould
We report threshold scattering properties for 39K(f = 1) atoms obtained from analysis of experimental photoassociation spectra of the purely long-range 39K 21 u state. The existence of hyperfine structure in the excited K 2 1 u state and a knowledge of the

Domain-Engineered Pyroelectric Radiometer

December 1, 1999
Author(s)
John H. Lehman, George P. Eppeldauer, J A. Aust, M. Racz
We built a large-area domain-engineered pyroelectric radiometer with high spatial and spectral response uniformity that is an excellent primary transfer standard for measurements in the near- and the mid-infrared wavelength regions.

Electrical Control of the Spatial Uniformity of Reactive Species in Plasmas

December 1, 1999
Author(s)
Mark A. Sobolewski, Kristen L. Steffens
We report a new method for controlling the spatial distribution of reactive chemical species in a parallel-plate reactor, by means of a variable-impedance load placed between the unpowered electrode and ground. The technique was demonstrated in 89% CF(sub4

Energy Dispersive X-Ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis

December 1, 1999
Author(s)
Dale E. Newbury, David A. Wollman, Kent D. Irwin, Gene C. Hilton, John M. Martinis
The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the

Equivalent Circuit Models for Coaxial OSLT Standards

December 1, 1999
Author(s)
Donald C. DeGroot, K. L. Reed, Jeffrey Jargon
We use a general description of transmission lines to develop analytic descriptions for offset OSLT (Open-Short-Load-Thru) standards used to calibrate vector network analyzers.

Exposure Parameters During Studies with ELF Magnetic and Electric Fields

December 1, 1999
Author(s)
Martin Misakian
Following a brief introduction to terminology that describes power frequency and other extremely low frequency [ELF] magnetic and electric fields, a short survey is given of methods for simulating and characterizing in a laboratory setting fields
Displaying 49201 - 49225 of 73832
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