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Displaying 49151 - 49175 of 74283

Improved Short-Term Stability of Optical Frequency Standards: Approaching 1 Hz in 1 s with the Ca Standard at 657 nm

January 1, 2000

Author(s)

Christopher W. Oates, E A. Curtis, Leo W. Hollberg

In Situ Atomic Absorption Monitoring with Substrate Reflection

January 1, 2000

Author(s)

S. P. Hays, Robert K. Hickernell, Kristine A. Bertness

We demonstrate a technique to apply real-time optical flux monitoring by in situ atomic absorption when the only available optical path through a molecular beam epitaxial growth chamber reflects from the substrate. Thin-film interference effects in the

Incorporation of Stereo-, Regio-, and Comonomer Defects Into the Crystalline Regions of Isotactic Polypropylene: Results From Nmr, Molecular Dynamics, and Chemical-Shift Calculations.

January 1, 2000

Author(s)

David L. VanderHart, Marc R. Nyden, R G. Alamo, L Mandelkern

Indentation Modulus and Hardness of Whisker-Reinforced Heat-Cured Dental Resin Composites

January 1, 2000

Author(s)

H H. Xu, Douglas T. Smith, Gary E. Schumacher, F Eichmiller, Joseph M. Antonucci

Recent studies showed that ceramic whisker reinforcement imparted a nearly two-fold increase in the strength of dental resin composites. The aim of the study was to investigate the indentation response and measure the elastic modulus hardness, and

Influence of Generation Number on the Dewetting of Hypergraft Poly(2-Ethyl-2-Oxazoline) Films

January 1, 2000

Author(s)

K A. Barnes, Jack F. Douglas, D W. Liu, B B. Bauer, Eric J. Amis, Alamgir Karim

Information model for machine-tool-performance tests:

January 1, 2000

Author(s)

Y Tina Lee, Johannes A Soons, M Alkan Donmez

Information models for design tolerancing::from conceptual to the detail design

January 1, 2000

Author(s)

R Sudarsan, U Roy, Y Narahari, RD Sriram, K W Lyons, N Pramanik

Information-based manufacturing program summary and accomplishments:

January 1, 2000

Author(s)

David C Stieren, Mark E Luce

Infrared and Raman studies of the Verwey transition in magnetite

January 1, 2000

Author(s)

L V. Gasparov, D B. Tanner, D B. Romero, H Berger, G Margaritondo, L Forro

Intensity of the Simultaneous Vibrational Absorption CO 2 (v 3 =1) + N 2 (v=1) larr} CO 2 (v 3 =0) + N 2 (v=0) at 4680 cm -1

January 1, 2000

Author(s)

B S. Mat{eacute}, Gerald T. Fraser, Walter J. Lafferty

Interacting Atoms under Strong Confinement

January 1, 2000

Author(s)

Eite Tiesinga, Carl J. Williams, F H. Mies, Paul S. Julienne

Intercombination and forbidden transition rates in C- and N-like ions (O 2 +, F 3 + and S 9 +) measured at a heavy ion storage ring

January 1, 2000

Author(s)

E Traebert, A G. Calamai, John D. Gillaspy, G Gwinner, X Tordoir, A Wolf

Intercomparison of regular spectral transmittance and reflectance measurements with monochromator and FTIR based spectrophotometers

January 1, 2000

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, E A. Early, Maria E. Nadal

Interface Between a Polysulfone and Polyamide as Studied by Combined Neutron Reflectivity and Small-Angle Neutron Scattering Techniques

January 1, 2000

Author(s)

Makoto Hayashi, TT Hashimoto, H Hasegawa, M Takenaka, H Grull, A R. Esker, M J. Weber, Sushil K. Satija, Charles C. Han, M Nagao

Interfacial Scattering of Hot Electrons in Ultrathin Au/Co Films

January 1, 2000

Author(s)

R P. Lu, B A. Morgan, K L. Kavanagh, Cedric J. Powell, P J. Chen, F Serpa, William F. Egelhoff Jr.

We have used room temperature, ballistic electron emission microscopy (BEEM) to measure hot-electron transport through ultra-thin Au/Co multilayre structures deposited onto Si. The samples consist of Au/Co/Si or (Au/Co) n/AuSi diodes, sputter deposited at

Interferometric Calibration of a Capacitance Displacement Sensor Over Short Displacement Ranges

January 1, 2000

Author(s)

R Koning, Ronald G. Dixson, Joseph Fu, G S. Peng, Theodore V. Vorburger

Capacitance displacement sensors, which are widely used to measure and control the true extension of piezoelectric actuators, have to be calibrated, if they are to be used for measurement purposes. We have investigated the calibration of a capacitance