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Displaying 49026 - 49050 of 73779

Thermally Induced Stress Relaxation and Densification of Spin-on-Glass Thin Films

January 1, 2000
Author(s)
C. K. Chiang, William E. Wallace, G W. Lynn, D Feiler, W. Xia
The stress-temperature relationship of silica spin-on-glass thin films on silicon wafers was studied. Upon heating the stress-temperature curves showed a dramatically increasing slope when the temperature of the film was greater than 340 C. At 450 C, a

Time Reversal in Polarized Neutron Decay - The emiT Experiment

January 1, 2000
Author(s)
G L. Jones, J M. Adams, J M. Anaya, T J. Bowles, T E. Chupp, K A. Coulterpark, Maynard S. Dewey, S J. Freedman, B K. Fujikawa, A Garcia, G L. Greene, S -. Hwang, L Lising, Hans Pieter Mumm, Jeffrey S. Nico, R G. Robertson, T D. Steiger, W A. Teasdale, Alan Keith Thompson, E G. Wasserman, Fred E. Wietfeldt, J F. Wilkerson

Transport Properties of Petroleum Fractions

January 1, 2000
Author(s)
M E. Baltatu, R A. Chong, Marcia L. Huber, Arno D. Laesecke
A corresponding-states model for the properties of petroleum fractions is presented.

Transport Property Measurements on the IUPAC Sample of 1,1,1,2-Tetrafluoroethane (R134a)

January 1, 2000
Author(s)
Marc J. Assael, A Leipertz, E MacPherson, Y Nagasaka, Carlos A. Nieto de Castro, Richard A. Perkins, K Strom, Eric M. Vogel, William A. Wakeham
This paper reports the results of an international project coordinated by the Subcommittee on Transport Properties of Commission 1.2 of the International Union of Pure and Applied Chemistry. The project has been conducted to investigate the large

Ultrasonic Research in the NIST Manufacturing Engineering Laboratory

January 1, 2000
Author(s)
Gerald V. Blessing, Steven E. Fick, Nelson N. Hsu, John A. Slotwinski
The Ultrasonics Standards Group in the Manufacturing Engineering Laboratory of the National Institute of Standards and Technology ( NIST) performs research, develops standards, and offers calibration services in support of United States industry. In this

Using Failure History to Improve Reliability in Information Technology

January 1, 2000
Author(s)
D Wallace
Achieving 100 % software reliability may seem an unreasonable goal. Software developers and consumers of many software products are largely unsure about the reliability of their product or purchase. Today, many opportunities exist for some assurance of
Displaying 49026 - 49050 of 73779
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