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Displaying 48901 - 48925 of 73929

New Developments in Deep Ultraviolet Laser Metrology for Photolithography

January 1, 2000
Author(s)
Marla L. Dowell, Christopher L. Cromer, Richard D. Jones, Darryl A. Keenan, Thomas Scott
Current and future laser measurement services at 157, 193, and 248 nm will be reviewed. Laser power and energy measurements at 193 nm will be presented, electrical calibration issues will be reviewed. We report an overall calibration uncertainty of laser

New Limit on the D Coefficient in Polarized Neutron Decay

January 1, 2000
Author(s)
L Lising, S R. Hwang, J M. Adams, T J. Bowles, M C. Browne, T E. Chupp, K A. Coulterpark, Maynard S. Dewey, S J. Freedman, B K. Fujikawa, A Garcia, G L. Greene, G L. Jones, Hans P. Mumm, Jeffrey S. Nico, J M. Richardson, R G. Robertson, W A. Teasdale, Alan K. Thompson, E G. Wasserman, Fred E. Wietfeldt, R C. Welsh, J F. Wilkerson

NIST artifact standards for fiber optic metrology

January 1, 2000
Author(s)
Paul A. Williams
The primary means of transferring fiber optic calibration metrology at the National Institute of Standards and Technology is through artifact standards called Standard Reference Materials (SRM). NIST currently provides SRMs for fiber geometry (fiber

NIST Atomic Spectra Database

January 1, 2000
Author(s)
Yuri Ralchenko, Jeffrey R. Fuhr, F -. Jou, Alexander Kramida, William C. Martin, Larissa Podobedova, Joseph Reader, Edward B. Saloman, Jean E. Sansonetti, Wolfgang L. Wiese

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Robert A. Clary, Michael L. McGlauflin, Eric P. Whitenton, Christopher J. Evans
Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These standard

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Christopher J. Evans, Michael L. McGlauflin, Eric P. Whitenton, Robert A. Clary
Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These standard
Displaying 48901 - 48925 of 73929
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