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Displaying 48726 - 48750 of 143780

yocto-Newton force detection sensitivity using trapped ions

August 22, 2010
Author(s)
Michael J. Biercuk, Joseph W. Britton, Hermann Uys, Aaron Vandevender, John Bollinger
Recent experimental advances have shown that it is possible to detect forces arising from electric fields at a level of aN/ √Hz (atto = 10 -18 through coupling of micro or nanofabricated mechanical resonators to a variety of physical systems including

PHOTOPOLYMERIZED DIMETHACRYLATE POLYMERS CONTAINING IN SITU GENERATED SILVER NANOPARTICLES

August 21, 2010
Author(s)
Yajun Cheng, Xinran Zhang, Diana N. Zeiger, Nancy Lin, Joseph M. Antonucci, Sheng Lin-Gibson
Polymeric nanocomposites containing silver are known to exhibit antibacterial activity. Here we demonstrate the synthesis and characterization of dimethacrylate/silver nanocomposites by coupling photopolymerization with in situ silver ion reduction. An

Cryogenic Fourier Transform Infrared Spectrometer from 4 to 20 Micrometers

August 20, 2010
Author(s)
Simon G. Kaplan, Solomon I. Woods, Timothy M. Jung, Adriaan C. Carter
We describe the design and performance of a cryogenic Fourier transform spectrometer (Cryo-FTS) operating at a temperature of approximately 15 K. The instrument is based on a porch-swing scanning mirror design with active alignment stabilization using a

Image specific error rate: A biometric performance metric

August 20, 2010
Author(s)
Elham Tabassi
Image-specific false match and false non-match error rates are defined by inheriting concepts from the biometric zoo. These metrics support failure mode analyses by allowing association of a covariate (e.g., dilation for iris recognition) with a matching

AFM characterization of nanopositioner in-plane stiffnesses

August 19, 2010
Author(s)
Seung Ho Yang, Yong Sik Kim, Premsagar P. Kavuri, Jae M. Yoo, Young M. Choi, Nicholas G. Dagalakis
A versatile method for measurement of in-plane stiffness of micro-elements was developed and its usefulness has been demonstrated. The in-plane stiffness of a NIST nanopositioner has been measured directly using a colloidal probe in an AFM without any

NEW Scanning Electron Microscope Magnification Calibration Reference Material (RM) 8820

August 19, 2010
Author(s)
Michael T. Postek, Andras Vladar, William J. Keery, Michael Bishop, Benjamin Bunday, John Allgair
Reference Material 8820 (RM 8820) is a new scanning electron microscope calibration reference material for nanotechnology and nanomanufacturingtion recently released by NIST. This standard was developed to be used primarily for X and Y scale (or

MTCONNECT-BASED KAIZEN FOR MACHINE TOOL PROCESSES

August 18, 2010
Author(s)
Byeong Eon Lee, John L. Michaloski, Frederick M. Proctor, Sid Venkatesh, Nils Bengtsson
Kaizen is a part of Lean Manufacturing that focuses on the concept of continuous improvement to reduce waste. For implementing Kaizen on the factory floor, comprehensive and efficient tools for data acquisition, process measurement and analysis are

Embedded Capacitive Displacement Sensor for Nanopositioning Applications

August 17, 2010
Author(s)
Svetlana Avramov-Zamurovic1, Nicholas Dagalakis, Rae Duk Lee, Yong Sik Kim, Jae M. Yoo, Seung H. Yang
The scale of nano objects requires very precise position determination. The state-of-the-art manipulators involve accurate nanometer positioning. This paper presents the design of a capacitive displacement sensor for a nanopositioning application. The
Displaying 48726 - 48750 of 143780
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