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Search Publications

NIST Authors in Bold

Displaying 48726 - 48750 of 73697

On the Properties of Alpha/Alpha + Beta Diffusion Couples

January 1, 2000
Author(s)
William J. Boettinger, Sam R. Coriell, Carelyn E. Campbell, Geoffrey B. McFadden
The properties of diffusion couples in a ternary system are examined theoretically when one end member is composed of single-phase material (alpha) and the other end member is composed of two-phase material (α + Β). Using the model of Morral and co-workers

Optical Fiber Power Measurements

January 1, 2000
Author(s)
Igor Vayshenker, Xiaoyu X. Li, David J. Livigni, Thomas Scott
We describe NIST measurement services for the calibration of optical fiber power meters. To augment the absolute power measurements NIST provides nonlinearity, spectral responsivity, and uniformity measurements. We explain the measurement standards

Optical Properties of Materials: A Sampling of NIST Contributions

January 1, 2000
Author(s)
Thomas A. Germer, R Gupta, Leonard M. Hanssen, Eric L. Shirley
Optics has found an extremely wide range of applications in industry and science, and the properties of the materials that make up optical instruments are key to their performance. Examples include glass for optical instrumentation such as telescopes and

Parameter Selection for Constrained Solutions to III-Posed Problems

January 1, 2000
Author(s)
Bert W. Rust
Many physical measurements are modeled by linear integral equations expressing each measurement as the sum of an instrumental smearing of the desired function and a random measuring error. Discretizing the integrals gives an ill-conditioned linear

PARCS - A Primary Atomic Reference Clock in Space

January 1, 2000
Author(s)
Thomas P. Heavner, Leo W. Hollberg, Steven R. Jefferts, D Meekhof, Thomas E. Parker, William D. Phillips, S L. Rolston, Neil Ashby, W Klipstein, L Maleki, D Seidel, R W. Thompson, L Young, R Vessot, E Mattison, A Demarchi

Performance Evaluation of a Parallel Cantilever Biaxial Micropositioning Stage

January 1, 2000
Author(s)
E Amatucci, Nicholas Dagalakis, John A. Kramar, Fredric Scire
The phenomenal growth of opto-electronic manufacturing and future applications in micro and nano manufacturing has raised the need for low-cost high performance micro-positioners. The National Institutes of Standards and Technology (NIST) Advanced

Phase Radiography with Neutrons

January 1, 2000
Author(s)
B E. Allman, P J. McMahon, K A. Nugent, D Paganin, David L. Jacobson, Muhammad D. Arif, S. A. Werner
Displaying 48726 - 48750 of 73697
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