Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Image specific error rate: A biometric performance metric

Published

Author(s)

Elham Tabassi

Abstract

Image-specific false match and false non-match error rates are defined by inheriting concepts from the biometric zoo. These metrics support failure mode analyses by allowing association of a covariate (e.g., dilation for iris recognition) with a matching error rate without having to consider the covariate of a comparison image. Image-specific error rates are also useful in detection of ground truth errors in test datasets. Images with higher image-specific error rates are more difficult to recognize, so these metircs can be used to assess the level of difficulty of test corpora or partition a corpus into sets with varying level of difficulty. Results on use of image-specific error rates for ground-truth error detection, covariate analysis and corpus partitioning is presented.sion on a per-user basis.
Conference Dates
August 22-26, 2010
Conference Location
Istanbul
Conference Title
20th International Conference on Pattern Recognition ICPR)

Keywords

biometric, performance, evaluation, security, error rate, quality

Citation

Tabassi, E. (2010), Image specific error rate: A biometric performance metric, 20th International Conference on Pattern Recognition ICPR), Istanbul, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904876 (Accessed October 9, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created August 20, 2010, Updated February 19, 2017
Was this page helpful?