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NIST Authors in Bold

Displaying 48651 - 48675 of 73697

Model of Fatigue Damage in Strain Rate-Sensitive Composite Materials

January 1, 2000
Author(s)
S K. Lee, Tinh Nguyen, Tze J. Chuang
A Fatigue damage accumulation model based on the Paris law has been proposed for strain rate-sensitive polymer composite materials. A pre-exponent factor c 2/f and strain-rate sensitive exponent n is introduced. Numerical analysis of the model has been

Modeling Grain Boundaries Using a Phase-Field Technique

January 1, 2000
Author(s)
James A. Warren, R Kobayashi, W Carter
We propose a two dimensional phase field model or grain boundary dynamics. One dimensional analytical solutions for a stable grain boundary in a bicrystal are obtained, and equilibrium energies are computed. By comparison with microscopic models of

Molecular Level Design of Fire Retardants and Suppressants (NISTIR 6275)

January 1, 2000
Author(s)
Marc R. Nyden
The various methods that comprise the field of molecular modeling are reviewed in the context of their potential for application to the molecular level design of new fire retardants and suppressants. The capabilities of these techniques are demonstrated by

Mosquito Noise in MPEG-compressed Video: Test Patterns and Metrics

January 1, 2000
Author(s)
Charles D. Fenimore, John M. Libert, Peter Roitman
Mosquito noise is a time dependent video compression impairment in which the high frequency spatial detail in video images having crisp edges is aliased intermittently. A new synthetic test pattern of moving spirals or circles is described which generates

Nanocomposites of Molecularly Dispersed Polyamidoamine (PAMAM) Dendrimers

January 1, 2000
Author(s)
G Kim, C L. Jackson, T J. Prosa, Da-Wei Liu, Barry J. Bauer
The preparation of PAMAM dendrimer nanocomposites in an IPN polymer matrix was investigated as a function of generation using transmission electron microscopy (TEM) and small angle X-ray scattering (SAXS). To obtain image contrast in TEM, sodium

Nanofabrication via Atom Optics

January 1, 2000
Author(s)
Jabez J. McClelland
A review is given of the field of nanofabrication via atom optics. Discussion is presented of the fundamentals of atom manipulation and atom optics, with emphasis on the aspects that are, or might be, useful for nanofabrication. The current status of

Nanoindentation of Polymers: Tip Shape Calibration and Uncertainty Issues

January 1, 2000
Author(s)
Mark R. VanLandingham, John S. Villarrubia, G Meyers
Indentation measurements made with atomic force microscopy (AFM) probes are relative measurements, largely due to the lack of information regarding the tip shape of the AFM probes. Also, current tip shape calibration procedures used in depth-sensing

Nanosecond Magnetization Reversal in High Coercivity Thin Films

January 1, 2000
Author(s)
N D. Rizzo, Thomas J. Silva, Anthony B. Kos
We used a wide-field Kerr microscope to measure magnetization reversal in high coercivity thin film media that were subjected to nanosecond field pulses. Coplanar waveguides were used as a field source. Two different samples of CoCr 10Ta 4 were measured
Displaying 48651 - 48675 of 73697
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