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Displaying 48651 - 48675 of 73830

Fire Dynamics Simulator: Technical Reference Guide (NISTIR 6467)

January 1, 2000
Author(s)
Kevin B. McGrattan, Howard R. Baum, Ronald G. Rehm, Anthony P. Hamins, Glenn P. Forney
The idea that the dynamics of a fire might be studied numerically dates back to the beginning of the computer age. Indeed, the fundamental conservation equations governing fluid dynamics, heat transfer, and combustion were first written down over a century

Fire Dynamics Simulator: User's Manual (NISTIR 6469)

January 1, 2000
Author(s)
Kevin B. McGrattan, Glenn P. Forney
Fire Dynamics Simulator (FDS) is a computational fluid dynamics (CFD) model of fire-driven fluid flow. The software described in this document solves numerically a form of the Navier-Stokes equations appropriate for low-speed, thermally-driven flow with an

Flammability of Polystyrene-Clay Nanocomposites

January 1, 2000
Author(s)
A B. Morgan, Jeffrey W. Gilman, Richard H. Harris Jr., C L. Jackson, C A. Wilkie, J Zhu
Research in the area of condensed phase flame retardants for polymers usually builds upon existing technologies, such as metal hydroxides (alumina, magnesium hydroxide) or phosphorus based materials. However, these materials tend to weaken mechanical

Flits: Pervasive Computing for Processor and Memory Constrained Systems

January 1, 2000
Author(s)
William J. Majurski, Alden A. Dima, Mary T. Laamanen
Many pervasive computing software technologies are targeted for 32-bit desktop platforms. However, there are innumerable 8, 16, and 32-bit microcontroller and microprocessor-based embedded systems that do not support the resource requirements of these

Force Metrology at NIST

January 1, 2000
Author(s)
Simone L. Yaniv, Thomas W. Bartel
This paper describes the measurements services, the instrumentation and procedures available for force metrology at the National Institute of Standards and Technology, USA. The uncertainty of the voltage ratio indicating system for strain gage load cells

Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy

January 1, 2000
Author(s)
J H. Scott, Eric S. Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C. Diebold
Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to investigate the accuracy and precision of TEM film thickness measurements and their

Generating Solitons by Phase Engineering of a Bose-Einstein Condensate

January 1, 2000
Author(s)
J Denschlag, J E. Simsarian, D L. Feder, Charles W. Clark, L A. Collins, J Cubizolles, Lu Deng, Edward W. Hagley, Kristian Helmerson, W P. Reinhardt, S L. Rolston, B I. Schneider, William D. Phillips
We demonstrate quantum phase engineering using two novel techniques that allow us to write and read the spatial phase of a Bose-Einstein condensate (BEC). We design and produce a quantum state by optically imprinting phasepatterns onto a condensate of

Growth & Magnetic Oscillatory Exchange Coupling of Mn/Fe (001) and Fe/Mn/Fe (001)

January 1, 2000
Author(s)
D Tulchinsky, John Unguris, Robert Celotta
The magnetic ordering and the interlayer exchange coupling in Mn and Fe/Mn wedge structures grown epitaxially on Fe(001) whisker substrates were investigated using scanning electron microscopy with polarization analysis (SEMPA). In bare Mn/Fe(001) samples
Displaying 48651 - 48675 of 73830
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