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Displaying 48376 - 48400 of 143806

Security Architecture Design Process for Health Information Exchanges (HIEs)

September 30, 2010
Author(s)
Matthew A. Scholl, Kevin M. Stine, Kenneth Lin, Daniel Steinberg
The purpose of this publication is to provide a systematic approach to designing a technical security architecture for the exchange of health information that leverages common government and commercial practices and that demonstrates how these practices

Defect depth profiling in gate dielectrics

September 29, 2010
Author(s)
Kin P. Cheung
Defects in gate dielectric greatly impact the performance and reliability of advanced MOSFETs. The introduction of high-k/metal gate technology makes the characterization of defects much more important and urgent. There are a limited number of methods

Contactless Approaches for RF Characterization of Metallic Nanowires

September 28, 2010
Author(s)
Kichul Kim, Paul Rice, Thomas M. Wallis, SangHyun S. Lim, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Dejan Filipovic
Two approaches for microwave characterization of nanowire (NW) conductivity are described in this paper. To remove the uncertainty associated with contacts, the NWs are either suspended above the center conductor of a coplanar waveguide (CPW) host or
Displaying 48376 - 48400 of 143806
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