U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 46876 - 46900 of 74160

Newton's Rings in Near-Field Optics

January 1, 2001
Author(s)
Lori S. Goldner, Jeeseong Hwang, Garnett W. Bryant, Michael J. Fasolka, P Absil, J V. Hryniewicz, F G. Johnson, H Shen, P T. Ho
We show how Newton's rings manifest themselves in near-field scanning optical microscopy and discuss how this effect can be used with topographic imaging to measure correlated roughness of thin films. In conventional optics, transmission through a thin

NIST Centenial Sessions August Second Two Thousand and One

January 1, 2001
Author(s)
W Anderson, Dennis A. Swyt, H Semerjian
The National Conference of Standards Laboratories International was formed in forty years ago (as NCSL) to promote cooperative efforts for solving the common problems faced by measurement laboratories. The principal driver for its establishment was the

NIST Mechanisms for Disseminating Measurements

January 1, 2001
Author(s)
T E. Gills, S Dittmann, Georgia L. Harris, C S. Brickenkamp, J R. Rumble, N M. Trahey
The National Bureau of Standards, predecessor of the National Institute of Standards and Technology, began providing the Nation with measurement artifacts and instruments in 1901 when the Office of Weights and Measures became part of the fledgling

NIST News from the Optoelectronics Division, Boulder, CO

January 1, 2001
Author(s)
Thomas Scott
The Optoelectronics Division supports the optoelectronics industry by providing new measurement techniques and standards to help characterize and assure the quality of their products.

NIST Recommended Practice Guide: Particle Size Characterization

January 1, 2001
Author(s)
Ajitkumar Jillavenkatesa, Lin-Sien H. Lum, Stanley Dapkunas
This guide is a compilation of essential facts and some fundamental information about commonly used techniques of particle size analysis in the ceramics industry. The guide is designed for the non- expert who may have some or little previous knowledge
Displaying 46876 - 46900 of 74160
Was this page helpful?