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Displaying 46651 - 46675 of 73929

NIST Mechanisms for Disseminating Measurements

January 1, 2001
Author(s)
T E. Gills, S Dittmann, Georgia L. Harris, C S. Brickenkamp, J R. Rumble, N M. Trahey
The National Bureau of Standards, predecessor of the National Institute of Standards and Technology, began providing the Nation with measurement artifacts and instruments in 1901 when the Office of Weights and Measures became part of the fledgling

NIST News from the Optoelectronics Division, Boulder, CO

January 1, 2001
Author(s)
Thomas Scott
The Optoelectronics Division supports the optoelectronics industry by providing new measurement techniques and standards to help characterize and assure the quality of their products.

NIST Recommended Practice Guide: Particle Size Characterization

January 1, 2001
Author(s)
Ajitkumar Jillavenkatesa, Lin-Sien H. Lum, Stanley Dapkunas
This guide is a compilation of essential facts and some fundamental information about commonly used techniques of particle size analysis in the ceramics industry. The guide is designed for the non- expert who may have some or little previous knowledge
Displaying 46651 - 46675 of 73929
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