NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 46426 - 46450 of 73697

NIST Mechanisms for Disseminating Measurements

January 1, 2001
Author(s)
T E. Gills, S Dittmann, Georgia L. Harris, C S. Brickenkamp, J R. Rumble, N M. Trahey
The National Bureau of Standards, predecessor of the National Institute of Standards and Technology, began providing the Nation with measurement artifacts and instruments in 1901 when the Office of Weights and Measures became part of the fledgling

NIST News from the Optoelectronics Division, Boulder, CO

January 1, 2001
Author(s)
Thomas Scott
The Optoelectronics Division supports the optoelectronics industry by providing new measurement techniques and standards to help characterize and assure the quality of their products.

NIST Recommended Practice Guide: Particle Size Characterization

January 1, 2001
Author(s)
Ajitkumar Jillavenkatesa, Lin-Sien H. Lum, Stanley Dapkunas
This guide is a compilation of essential facts and some fundamental information about commonly used techniques of particle size analysis in the ceramics industry. The guide is designed for the non- expert who may have some or little previous knowledge
Displaying 46426 - 46450 of 73697
Was this page helpful?