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Displaying 45601 - 45625 of 73697

Structure and Property Characterization of Low-k Dielectric Porous Thin Films

April 1, 2001
Author(s)
Barry J. Bauer, Eric K. Lin, V. J. Lee, Haonan Wang, Wen-Li Wu
High-resolution X-ray reflectivity and small angle neutron scattering measurements are used as complementary techniques to characterize the structure and properties of porous thin films for use as low-k interlevel dielectric (ILD) materials. With the

The Bismuth Abundance in the HgMn Stars chi) Lupi and HR7775 and Improved Atomic Data for Selected Transitions of Bi I, Bi II, and Bi III

April 1, 2001
Author(s)
G Wahlgren, T Brage, J C. Brandt, J Fleming, S Johansson, D S. Leckrone, C R. Proffitt, Joseph Reader, Craig J. Sansonetti
High resolution spectra of the chemically peculiar HgMn type stars Χ Lupi and HR7775 obtained with the Hubble Space Telescope/Goddard High Resolution Spectrograph are investigated for their abundance of bismuth. HR7775, previously known from International

The Influence of Molecular Architecture and Solvent Type on the Size and Structure of Poly (Bezyl Ether) Dendrimers by SANS

April 1, 2001
Author(s)
G Evmenenko, Barry J. Bauer, R Kleppinger, B Forier, W Dehaen, Eric J. Amis, N Mischenko, H Reynaers
The size of poly(benzyl ether) dendrimers with different molecular architectures was measured by small angle neutron scattering (SANS). Both polar and non-polar solvents were used to measure the effect of solvent type. The radius of gyration (Rg) of all of

The Location of Very Small Particles in Silane RF Discharge

April 1, 2001
Author(s)
K Rozsa, G Bano, Alan Gallagher
The size and location of silicon particles that grow in a pure silane, capacitively coupled RF discharge, are measured by laser light scattering. The discharge conditions were similar to those typically used to produce amorphous silicon devices, except the

The Location of Very Small Particles in Silane RF Discharges

April 1, 2001
Author(s)
K Rozsa, G Bano, Alan Gallagher
The size and location of silicon particles that grow in a pure silane, capacitively coupled rf discharge are measured by laser light scattering.The discharge conditions were similar to those typically used to produce amorphous silicon devices, except the

Thermal Conductivities of Alternatives to CFC-11 for Foam Insulation

April 1, 2001
Author(s)
Richard A. Perkins, L -. Cusco, J -. Howley, Arno R. Laesecke, S -. Matthes, M L. Ramires
The present work examines the thermal conductivities of several dilute vapors which are potential alternatives to chlorofluorocarbons (CFCs) for cellular-plastic foams. Thermal conductivity data are reported in the vapor phase, from 280 to 340 K, for

Thermodynamic and Structural Aspects of the Potential Energy Surface of Simulated Water

April 1, 2001
Author(s)
Francis W. Starr, Srikanth Sastry, E LaNave, A Scala, H E. Stanley, F Sciortino
Relations between the thermodynamics and dynamics of supercooled liquids approaching the glass transition have been propposed over many years. This connections is most obvious at low temperatures where the motion of the system can be partitioned into

Thermomechanical Oscillations in Material Flow During High-Speed Machining

April 1, 2001
Author(s)
Matthew A. Davies, Timothy J. Burns
This paper presents a nonlinear dynamics approach for predicting the transition from continuous to shear-localized chip formation in machining. Experiments and a simplified one-dimensional model of the flow both show that, as cutting speed is increased, a
Displaying 45601 - 45625 of 73697
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