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NIST Authors in Bold

Displaying 45476 - 45500 of 73460

NIST-Sponsored Interlaboratory Comparison of Polystyrene Molecular Mass Distribution Obtained by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry: Statistical Analysis

March 1, 2001
Author(s)
Charles M. Guttman, S Wetzel, William R. Blair, B M. Fanconi, Kathleen M. Flynn, R J. Goldschmidt, William E. Wallace, David L. VanderHart
Matrix-assisted laser desorption/ionization time of flight mass spectrometry (MALDI-TOF-MS) is becoming a new and important technique in synthetic polymer characterization. Yet much is still unknown about the molecular mass distribution (MWD) which is

Noncontact Thermometry in the Optical Technology Division at NIST

March 1, 2001
Author(s)
Charles E. Gibson, Howard W. Yoon, Benjamin K. Tsai, Bettye C. Johnson, Robert D. Saunders
The Optical Technology Division (OTD) at the National Institute of Standards and Technology (NIST) maintains the thermodynamic temperature scale above the silver freezing point using spectral radiance ratios according to the International Temperature Scale

On the Gibbs Adsorption Equation for Diffuse Interface Models

March 1, 2001
Author(s)
Geoffrey B. McFadden, A A. Wheeler
In this paper we discuss some applications of the classical Gibbs adsorption equations to specific diffuse interface models that are based on conserved and non-conserved order parameters. Such models are natural examples of the general methodology

On-Wafer Measurements of Nonlinear Effects in High Temperature Superconductors

March 1, 2001
Author(s)
James Booth, Leila R. Vale, Ronald H. Ono
We present the results of comprehensive on-wafer microwave probe station measurements of the nonlinear properties of coplanar waveguide devices patterned from HTS thin films. We introduce a sequence of measurements and analysis that is designed to describe

Optical Metrology for Wavelength-Division-Multiplexed Fiber Communications

March 1, 2001
Author(s)
Sarah L. Gilbert, Shellee D. Dyer, Paul A. Williams, Allen Rose
In response to rapid changes in fiber-optic technology, the Optoelectronics Division of the National Institute of Standards and Technology has been developing techniques and standards to support the measurement of optical components and subsystems used in

Optical Path Difference Measurement Techniques for SLMs

March 1, 2001
Author(s)
Patrick J. Grother, D P. Casasent
A simple measurement method to obtain 2-D spatial point-by-point optical path difference (OPD) data for spatial light modulators (SLMs) is described. A simple imaging system is used that allows measurements of all SLM parameters on the same laboratory

Periodic Table: Atomic Properties of the Elements

March 1, 2001
Author(s)
Robert A. Dragoset
Periodic Table: Atomic Properties of the Elements. This is version 2, which incorporates previously published revisions of mass numbers for some stable isotopes.

Quantum Chemistry

March 1, 2001
Author(s)
Carlos A. Gonzalez
In this short essay, the current status of quantum chemistry as well as the future challenges this discipline have to face in order to become a useful tool in the investigation of large-scale chemical problems is presented.

Reference Materials for DNA Analysis

March 1, 2001
Author(s)
Barbara C. Levin, D J. Reeder
Mention has already been made, in Section 5.1. Of the use of DNA-based techniques for control of microbiological DNA. In parallel to the work of ATCC the USA National Institute of Standards and Technology (NIST) developed three Standard Reference Materials

Second Harmonic Magneto-Resistive Imaging to Authenticate and Recover Data From Magnetic Storage Media

March 1, 2001
Author(s)
David P. Pappas, C S. Arnold, G Shalev, C Eunice, D Stevenson, Steven Voran, Mike E. Read, Erin M. Gormley, James Cash, Ken Marr, James Ryan
A scanning magneto-resistive microscope was developed that allows for high resolution imaging of magnetic tapes and digital media. By using second harmonic detection to remove thermal anomalies we are able to image sufficient lengths of tape for

Shape-Sensitive Linewidth Measurement with the SEM Using a Model-Based Library

March 1, 2001
Author(s)
John S. Villarrubia, Andras Vladar, J R. Lowney, Michael T. Postek
In semiconductor electronics manufacturing, device performance often depends upon size. For example, microprocessor speed is linked to the width of transistor gates. Accurate measurement of feature width is an important but challenging problem. When a

SiC Power Diodes Provide Breakthrough Performance for a Wide Range of Applications

March 1, 2001
Author(s)
Allen R. Hefner Jr., Ranbir Singh, Jih-Sheng Lai, David W. Berning, Sebastien Bouche, Christophe C. Chapuy
The electrical performance of Silicon Carbide (SiC) diodes are evaluated and compared to commercially available Silicon (Si) diodes in the voltage range from 600 V through 5000 V. The comparisons include the on-state characteristics, the reverse recovery

Slab Effects in SMRF Retrofit Connection Tests

March 1, 2001
Author(s)
S A. Civjan, M D. Engelhardt, John L. Gross
A series of six full-scale subassemblages were tested to investigate dogbone and haunch retrofits for pre-Northridge steel moment connections. Tests included matched pairs of specimens, one bare steel and one including composite slab. Data were collected

Spectrum and Energy Levels of Singly-Ionized Mercury (Hg II)

March 1, 2001
Author(s)
Craig J. Sansonetti, Joseph Reader
The spectrum of singly-ionized mercury (Hg II) has been observed from 500 to 9880 with sliding sparks and pulsed-RF discharges on 10.7-m grating spectrographs in vacuum and air. About 500 lines have been classified as transitions between 114 energy levels

SQUID Operational Amplifier

March 1, 2001
Author(s)
Kent D. Irwin, Martin Huber
The nonlinear response of Superconducting Quantum Interface Devices (SQUIDs) has limited their usefulness. We propose the SQUID Operational Amplifier, which consists of several stages of SQUIDs with high open-loop current gain. When connected in a negative
Displaying 45476 - 45500 of 73460
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