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Displaying 451 - 475 of 2717

A reference high-pressure CO2 adsorption isotherm for ammonium ZSM-5 zeolite: results of an interlaboratory study

July 26, 2018
Author(s)
Huong Giang T. Nguyen, Laura Espinal, Roger D. van Zee, Matthias Thommes, Blaza Toman, Sterlin Hudson, Enzo Mangano, Stefano Brandani, Katie Cychosz, Pieter Bertier, Feng Yang, Bernhard Krooss, Rebecca Siegelman, Jeffrey Long, Yoko Nakada, Kazu Nakai, Armin Ebner, James Ritter, Aaron Moran, Orhan Talu, Yi Huang, Krista Walton, Pierre Billemont, Guy de Weireld
This paper reports the results of an international interlaboratory study led by the National Institute of Standards and Technology (NIST) on the measurement of high-pressure surface excess carbon dioxide adsorption isotherms on NIST Reference Material RM

Imaging Through Fire Using Narrow-Spectrum Illumination

July 23, 2018
Author(s)
Christopher M. Smith, Matthew Hoehler
This paper demonstrates a simple method to enhance visibility through clean-burning flames that allows new opportunities to perform optical metrology in fire research. The method combines narrow-spectrum, blue illumination and matched optical filters to

A radial calibration window for analytical ultracentrifugation

July 20, 2018
Author(s)
Thomas W. LeBrun, Peter Schuck, Wei Ren, Justine Yoon, Xianghui Dong, Nicole Y. Morgan, Jeffrey Fagan, Huaying Zhao
Analytical ultracentrifugation (AUC) is a first-principles based method for studying particles in solution by monitoring the evolution of their radial concentration distribution as a function of time in the presence of a high centrifugal field. In

Epitaxial Graphene for High-Current QHE Resistance Standards

July 9, 2018
Author(s)
Mattias Kruskopf, Jiuning Hu, Bi Y. Wu, Yanfei Yang, Hsin Y. Lee, Albert F. Rigosi, David B. Newell, Randolph E. Elmquist
We report the growth of large-area monolayer graphene on the centimeter scale using an optimized growth process allowing for reproducibility and morphology improvements. Magneto-transport measurements on graphene quantum Hall effect devices demonstrate the

Epitaxial Graphene p-n Junctions

July 9, 2018
Author(s)
Jiuning Hu, Mattias Kruskopf, Yanfei Yang, Bi Y. Wu, Jifa Tian, Alireza R. Panna, Albert F. Rigosi, Hsin Y. Lee, George R. Jones Jr., Marlin E. Kraft, Dean G. Jarrett, Kenji Watanabe, Takashi Taniguchi, Randolph E. Elmquist, David B. Newell
We report the fabrication and measurement of top gated epitaxial graphene p-n junctions where exfoliated hexgonal boron nitride (hBN) is used as the gate dielectric. The four terminal longitudinal resistance across a single junction is well quantized at R_

DC Comparison of a Programmable Josephson Voltage Standard and a Josephson Arbitrary Waveform Synthesizer

July 7, 2018
Author(s)
Alain Rufenacht, Nathan Flowers-Jacobs, Anna Fox, Steven B. Waltman, Robert E. Schwall, Paul Dresselhaus, Samuel P. Benz, Charles J. Burroughs
We present the first dc comparison of a programmable Josephson voltage standards and a pulse- driven Josephson arbitrary waveform synthesizer (JAWS) at 3 V. Both devices are mounted side- by-side on the cold stage of a cryocooler. The relative agreement

Measuring the Leakage Current to Ground in Programmable Josephson Voltage Standards

July 7, 2018
Author(s)
Alain Rufenacht, Charles J. Burroughs, Paul Dresselhaus, Samuel P. Benz
The voltage error associated with the leakage current of programmable Josephson voltage standards (PJVS) is one of the largest contributions to the uncertainty in direct comparison of voltage standards. Due to the parallel biasing scheme of the PJVS and

Three Volt Pulse-Driven Josephson Arbitrary Waveform Synthesizer

July 7, 2018
Author(s)
Nathan Flowers-Jacobs, Alain Rufenacht, Anna Fox, Steven B. Waltman, Justus Brevik, Paul Dresselhaus, Samuel P. Benz
This paper describes a new generation of Josephson Arbitrary Waveform Synthesizers which generate ac waveforms with a root-mean-squared (rms) amplitude of 3 V over a quantum-accurate operating range greater than 1 mA at 1 kHz. This system is composed of

Automated Direct Comparison of Two Cryocooled 10 Volt Programmable Josephson Voltage Standards

July 6, 2018
Author(s)
Alain Rufenacht, Yi-hua D. Tang, Stephane Solve, Anna E. Fox, Paul D. Dresselhaus, Charles J. Burroughs, Robert E. Schwall, Regis Chayramy, Samuel P. Benz
We have performed direct dc comparisons between two cryocooled 10 V programmable Josephson voltage standards utilizing an automated synchronization scheme for the voltage reversals, which enables the use of a high-sensitivity analog null detector on its 10

Walk-through Metal Detector Testing and the Need to Emulate Natural Body Motion

July 5, 2018
Author(s)
Nicholas G. Paulter Jr., Donald R. Larson, Nicklaus F. Troje
The effect of motion through the portal of a walk-through metal detector (WTMD) has often been considered to contribute to the uncertainty in detecting threat objects being carried through the WTMD. However, typical metrological testing uses a robotic

Recommended practice for calibrating vacuum gauges of the ionization type

April 27, 2018
Author(s)
James A. Fedchak, Patrick J. Abbott, Jay H. Hendricks, Paul C. Arnold, Neil T. Peacock
This document represents a recommended practice for the calibration of ionization gauges using the comparison method. In this method, ionization gauges are compared to a working standard that has an SI traceable calibration. The ionization gauge is either

How measurement science can improve confidence in research results

April 23, 2018
Author(s)
Anne L. Plant, Chandler A. Becker, Robert J. Hanisch, Ronald F. Boisvert, Antonio M. Possolo, John T. Elliott
The concepts and methods of measurement science can help provide clarity in the definition of reproducibility and its role in the scientific process. The qualities of rigorous research include reproducibility as one component, but there are other important

Virtual Metrology White Paper - INTERNATIONAL ROADMAP FOR DEVICES AND SYSTEMS(IRDS)

April 9, 2018
Author(s)
Ndubuisi G. Orji, Yaw S. Obeng, Carlos Beitia, Supika Mashiro, James Moyne
This white paper provides an overview of virtual metrology (VM) and the benefits it can provide, with cost reduction (both capital expenditure and cycle time) being the primary benefit. The white paper also examines some of the issues preventing wider
Displaying 451 - 475 of 2717
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