September 1, 2002
Author(s)
J D. Buchanan, T P. Hase, B K. Tanner, P J. Chen, L Gan, Cedric J. Powell, William F. Egelhoff Jr.
The interdiffusion lengths in thin film samples of the form X/Al and Al/X, where X is a metal from rows 4,5 and 6 of the Periodic Table, have been measured by Grazing Incidence X-ray Scattering. Scans of the specular reflectivity have been fitted to