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Displaying 43126 - 43150 of 73779

Controlled Barrier Modification in Nb/NbOx/Ag Metal Insulator Metal Tunnel Diodes

June 15, 2002
Author(s)
Erich N. Grossman, Todd E. Harvey, Carl D. Reintsema
The nonlinear electrical transport properties of metal-insulator-metal (MIM) tunnel diodes based on a barrier of naturally grown niobium oxide have been measured at room temperature and analyzed. In most cases excellent agreement is found between the

A Macro-Micro Motion System for a STM

June 13, 2002
Author(s)
Bradley N. Damazo, James D. Gilsinn, Richard M. Silver, Hui Zhou
As nano-lithography improves, more companies and research groups have the capability to create nano-scale structures. Scanning Tunneling Microscopes (STMs) are commonly used to create these structures and evaluate them afterward. One difficulty is that

Evaluation of Component-Based Reconfigurable Machine Controllers

June 13, 2002
Author(s)
S Kolla, John L. Michaloski, William G. Rippey
The lack of interoperability and integration standards is severely hindering manufacturing productivity. To address this problem, a General Motion Control (GMC) Testbed has been developed at National Institute of Standards and Technology (NIST) with one of

Tying Together Design, Process Planning and Machining with Step-NC Technology

June 13, 2002
Author(s)
Frederick M. Proctor, John L. Michaloski, William P. Shackleford
While simulation has been successful in tying design and process planning into an iterative loop, machining has traditionally been a downstream terminus of the manufacturing cycle. Simulation of machining has proven difficult due to the highly dynamic and

Evaluation Methodologies for Information Management Systems

June 11, 2002
Author(s)
Emile L. Morse
The projects developed under the auspices of the Defense Advanced Research Projects Agency (DARPA) Information Management (IM) program are innovative approaches to tackle the hard problems associated with delivering critical information in a timely fashion

Laser-Focused Nanofabrication: Beating of Two Atomic Resonances

June 10, 2002
Author(s)
E Jurdik, K van, J Hohlfeld, T Rasing, Jabez J. McClelland
We deposit a laser-collimated chromium beam onto a substrate through a laser standing-wave (SW) tuned above the atomic resonance at either of the two 52Cr transitions 7S 3rarr} 7P° 3 at 427.600 nm or 7S 3rarr} 7P° 4 at 425.553 nm. In both these cases the

Group Delay Description for Broadband Pulses

June 7, 2002
Author(s)
M J. Ware, S A. Glasgow, J Peatross
The traditional concept of group delay usually arises in connection with an expansion of the phase delay for an electromagnetic pulse. In this context, the group delay function (evaluated at a single 'carrier' frequency) describes the time required for a

Simulations of Noise-Parameter Uncertainties

June 7, 2002
Author(s)
James P. Randa
This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlying

Vector Corrected Noise Temperature Measurements

June 7, 2002
Author(s)
Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James P. Randa
A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using isolators

Repeat Measurements and Metrics for Nonlinear Model Development

June 6, 2002
Author(s)
Catherine A. Remley, Jeffrey A. Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.

Measuring Clock Jitter at 100 GHz from PM Noise Measurements

June 3, 2002
Author(s)
David A. Howe
"Jitter" is the noise modulation due to random time shifts on an otherwise ideal, or perfectly on-time, signal transition. This paper presents ways of calculating timing jitter using phase- modulation (PM) and amplitude-modulation (AM) noise measurements

A 10T Mohm Per Step Hamon Transfer Standard

June 1, 2002
Author(s)
Dean G. Jarrett
To evaluate high resistance measurements and scaling in the range 1 Tohm to 100 Tohm, a 10 Tohm per step Hamon transfer standard is being developed. The design uses fabrication techniques developed in recent years at NIST to construct high resistance

A Critical Evaluation of Interlaboratory Data on Total, Elemental, and Isotopic Carbon in the Carbonaceous Particle Reference Material, NIST SRM 1649a

June 1, 2002
Author(s)
Lloyd A. Currie, Bruce A. Benner Jr, H A. Cachier, R Cary, J C. Chow, David L. Urban, T. I. Eglinton, O Gustafsson, P C. Hartmann, J I. Hedges, J D. Kessler, T Kirchstetter, D Klinedinst, George A. Klouda, J V. Marolf, C A. Masiello, T Novakov, A. Pearson, K M. Prentice, H Puxbaum, J G. Quinn, C. M. Reddy, H Schmid, J F. Slater, Stephen A. Wise, J Watson
A primary purpose of this report is to provide documentation for the new isotopic and chemical particulate carbon data for certified, reference and information values in Tables 12 and 13 of the Certificate of Analysis. Supporting this is a critical review

A Decomposition-Based Approach to Layered Manufacturing

June 1, 2002
Author(s)
I Llinkin, R Janardan, J J. Majhi, J Schwerdt, Miles E. Smid, Ram D. Sriram
This paper introduces a new approach for improving the performance and versatility of Layered Manufacturing (LM), which is an emerging technology that makes it possible to build physical prototypes of 3D parts directly from their computer models using a

A High-Energy X-Ray Spectrometer Diagnostic for the OMEGA Laser

June 1, 2002
Author(s)
Lawrence T. Hudson, Albert Henins, R Deslattes, J Seely, G Holland, R Atkin, L Marlin, D D. Meyerhofer, C Stoeckl
A new x-ray diagnostic has been commissioned recently at the OMEGA laser facility at the University of Rochester. It is a transmission curved crystal spectrometer designed primarily to characterize the hot-electron energy distribution of laser generated

A Microshear Test to Measure Bond Strengths of Dentin-Polymer Interfaces

June 1, 2002
Author(s)
Walter G. McDonough, Joseph M. Antonucci, J He, Y Shimada, Martin Y. Chiang, Gary E. Schumacher, Carl R. Schultesiz
Mechanical property tests such as the diametral tensile, uniaxial tensile and transverse strength tests are commonly used in studying the interfacial properties of the bond between dental composites and dental substrates such as dentin and enamel. These
Displaying 43126 - 43150 of 73779
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