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Development of Ballistics Identification - From Image Comparison to Topography Measurement in Surface Metrology-

Published

Author(s)

Jun-Feng Song, Theodore V. Vorburger, Robert M. Thompson, Thomas Brian Renegar, Xiaoyu Alan Zheng, James H. Yen, Richard M. Silver, Wei Chu

Abstract

Fired bullets and ejected cartridge cases have unique ballistics signatures left by the firearm. By analyzing the ballistics signatures, forensic examiners can trace these bullets and cartridge cases to the firearm used in a crime scene. Current automated ballistics identification systems are primarily based on image comparisons using optical microscopy. The correlation accuracy depends on image quality which is largely affected by lighting conditions. Because ballistics signatures are geometrical micro-topographies by nature, direct measurement and correlation of the surface topography is being investigated for ballistics identification. A Two-dimensional (2D) and Three-dimensional (3D) Topography Measurement and Correlation System was developed at NIST for certification of NIST Standard Reference Material (SRM) 2460/2461 Bullets and Cartridge Cases. Based on this system, a prototype system for bullet signature measurement and correlation has been developed at NIST for bullet signature identifications, and has demonstrated superior correlation results.
Citation
Measurement Science & Technology
Volume
23

Keywords

Surface metrology, topography measurement, forensic science, ballistics identificationp, standard bullet, standard cartridge case Surface metrology, topography measurement, forensic science, ballistics identification, standard bullet, standard cartridge case

Citation

Song, J. , Vorburger, T. , Thompson, R. , , T. , , X. , Yen, J. , , R. and Chu, W. (2012), Development of Ballistics Identification – From Image Comparison to Topography Measurement in Surface Metrology-, Measurement Science & Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908043 (Accessed December 6, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 21, 2012, Updated February 19, 2017