NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 43076 - 43100 of 73697

An Improved Sensor for the NIST Cryogenic Thermal Transfer Standard

June 1, 2002
Author(s)
Thomas E. Lipe Jr., Carl D. Reintsema, Joseph R. Kinard Jr.
We are developing a new primary standard of ac-dc difference, based on a resistive superconducting transition-edge sensor. We describe the performance limitations of the present device, and present a new sensor design which will improve the operating

An Updated Set of Basic Linear Algebra Subprograms (BLAS)

June 1, 2002
Author(s)
L S. Blackford, Roldan Pozo, Et al
This paper updates the ongoing BLAS effort, and summarizes what types of operations are now available. We now have flavors of BLAS for dense, banded, and sparse vector and matrix operations. Some BLAS are also supported in extended and mixed precision

Applying a Methodology for Microtensile Analysis of Thin Films

June 1, 2002
Author(s)
B Yeung, Alan M. Lytle, V Sarihan, David T. Read, Y F. Guo
A Microtensile methodology, developed at The National Institute of Standards and Technology (NIST), has been adopted and applied in Motorola to evaluate material properties of thin films. this methodology is a significant part of the materials technology

Calibration of a Stopping Power Model for Silicon Based on Analysis of Neutron Depth Profiling and Secondary Ion Mass Spectrometry Measurements

June 1, 2002
Author(s)
Kevin J. Coakley, Huaiyu H. Chen-Mayer, George P. Lamaze, David S. Simons, P E. Thompson
We measure the boron concentration versus depth profile within a silicon sample with four delta-doped planes by secondary ion mass spectrometry. In a neutron depth profiling (NDP) experiment, we illuminate the sample with a neutron beam. Nuclear reactions

CD Reference Materials for Sub-Tenth Micrometer Applications

June 1, 2002
Author(s)
Michael W. Cresswell, E. Hal Bogardus, Joaquin (. Martinez, Marylyn H. Bennett, Richard A. Allen, William F. Guthrie, Christine E. Murabito, B A. am Ende, Loren W. Linholm
Prototype linewidth reference materials with Critical Dimensions (CDs) as narrow as 70 nm have been patterned in (110) silicon-on-insulator films. The sidewalls of the reference features are parallel, normal to the substrate surface, and have almost

Ceramic Based Layer Structures for Biomechanical Applications

June 1, 2002
Author(s)
Brian R. Lawn
A survey of recent advances in the analysis of ceramic-based layer structures for biomechanical applications is presented. Data on model layer systems, facilitating development of explicit fracture mechanics relations for predicting critical loads to

Compact Force Sensors for Low-Force Mechanical Probe Calibration

June 1, 2002
Author(s)
Douglas T. Smith, S Woody, Jon R. Pratt
The loading mechanisms of instrumented indentation machines are often calibrated using deadweights. In many cases, due to the geometry of the loading frame, the applied deadweight is tensile, while the indentation leads to be measured are compressive. In

Contingency Planning Guide for Information Technology Systems

June 1, 2002
Author(s)
Elizabeth B. Lennon
This ITL Bulletin summarizes NIST SP 800-34, Contingency Planning Guide for Information Technology Systems. It describes the process of developing contingency plans, procedures, and technical measures that can enable a system to be recovered quickly and

Continuously Tunable Precise, Single Frequency Optical Signal Generator

June 1, 2002
Author(s)
J D. Jost, John L. Hall, Jun Ye
To realize a genuine CW optical frequency synthesizer, a continuously tunable single-frequency CW laser has been employed to track preciselyany arbitrary component of a wide bandwidth phase-stabilized optical comb. We dermnstrate in experiment two

Convective and Morphological Instabilities During Crystal Growth

June 1, 2002
Author(s)
Geoffrey B. McFadden, Sam R. Coriell, B T. Murray
During crystal growth or solidification of a binary alloy from a liquid phase, temperature and solute gradients are inherently present and can give rise to fluid flow in the melt. The interaction of fluid flow with the crystal-meltinterface plays an

Cracking in Brittle Laminates from Concentrated Loads

June 1, 2002
Author(s)
H Chai, Brian R. Lawn
A study is made of the crack resistance of multilaminates consisting of brittle layers interleaved with compliant interlayers and bonded to compliant substrates. Specific attention is paid to flexure generated radial cracks in the undersurfaces of

Crystal Structure of the Compound Bi 2 Zn 2/3 Nb 4/3 O 7

June 1, 2002
Author(s)
Igor Levin, T G. Amos, J Nino, Terrell A. Vanderah, I Reaney, C A. Randall, M T. Lanagan
The crystal structure of Bi2Zn2/3Nb4/3O7 was determined using a combination of electron, X-ray and neutron powder diffraction. The compound crystallizes with a monoclinic zirconolite-like structure (C2/c (No.15) space group, a=13.1037(9) , b=7.6735(3) , c

Data-Assisted Design for Wind Loading

June 1, 2002
Author(s)
Emil Simiu, Fahim Sadek, T Whalen, S Jang, L L. Lu, S M. Diniz, A Grazini, Michael A. Riley
Current ASCE Standard provisions on wind loads for low-rise building design are based on wind tunnel tests conducted at the University of Western Ontario in the 1970's. In spite of the advances they entailed at the time, those provisions are inadequate
Displaying 43076 - 43100 of 73697
Was this page helpful?