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NIST Authors in Bold

Displaying 42001 - 42025 of 73697

Quantum information processing with trapped ions,

January 1, 2003
Author(s)
David J. Wineland, Murray D. Barrett, Joseph W. Britton, J Chiaverini, B. L. DeMarco, Wayne M. Itano, Branislav M. Jelenkovic, Christopher Langer, Dietrich G. Leibfried, Till P. Rosenband, T Schaetz
Experiments directed towards the development of a quantum computer based on trapped atomic ions are described briefly. We discuss the implementation of single-qubit operations and gates between qubits. A geometric phase gate between two ion qubits is

Radio-Frequency Technology Division: Programs, Activities, and Accomplishments

January 1, 2003
Author(s)
Robert M. Judish, Dennis S. Friday
This publication describes the programs in the Radio-Frequency Technology Division, of the National Institute of Standards and technology. The Radio-Frequency Technology Division is a critical national resource for a wide range of customers. U. S. industry

Reactive epitaxy of beryllium on Si(1 1 1)-(7 x 7)

January 1, 2003
Author(s)
Dustin Hite, Shu-Jung Tang, Phillip T. Sprunger
Scanning tunneling microscopy (STM) and photoelectron spectroscopy (PES) have been used to investigate the nucleation, growth, and structure of beryllium on Si(1 1 1)-(7 x 7). STM indicates that a chemical reaction occurs at temperatures as low as 120 K

Recent Developments in the Characterization of Anisotropic Void Populations in Thermal Barrier Coatings Using Ultra-Small Angle X-ray Scattering

January 1, 2003
Author(s)
Gabrielle G. Long, T A. Dobbins, Andrew J. Allen, J Ilavsky, P Jemain, A Kulkarni, H Herman
Thermal barrier coatings (TBC) have complex void microstructures which control their in service properties. In the research reported here, ultra-small-angle X-ray scattering (USAXS) has been used to characterize anisotropic void populations in TBC s. A new

Recent Results of NIST Realizations of the ITS-90 Below 84 K

January 1, 2003
Author(s)
Weston L. Tew, Christopher W. Meyer
The results at NIST of realizations and comparisons of the ITS-90 below 84 K are presented. The 3He and 4He vapor pressure scales (0.65 K to 5.0 K), and the interpolating constant volume gas thermometer (ICVGT) scale (5.0 K to 24.556 K) as realized from
Displaying 42001 - 42025 of 73697
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