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Displaying 40201 - 40225 of 74099

Single-Electron Transistor Spectroscopy of InGaAs Self-Assembled Quantum Dots

January 1, 2004
Author(s)
Kevin Osborn, Mark W. Keller, Richard Mirin
A single-electron transistor is used to detect tunneling of single electrons into self-assembled InGaAs quantum dots. Aluminum single-electron transistors (SETs) are fabricated over an MBE-grown structure containing quantum dots (QDs) and an underlying n

Spot Weld Analysis with Two-Dimensional Ultrasonic Arrays

January 1, 2004
Author(s)
D A. Denisov, Craig M. Shakarji, R G. Maev, J M. Paille, B B. Lawford
This paper describes a threefold method of testing the performance of an array-based ultrasonic tool for nondestructive testing of spot welds. The tool is described in its capabilities, use, and advantages over existing counterparts. Performance testing is

Standards for Optical Communications and Sensing

January 1, 2004
Author(s)
Gordon W. Day
This paper provides a review of experience in the development of standards for optical communications and sensing, considering lessons that may be useful in the development of standards for other Information Technology (IT) services.
Displaying 40201 - 40225 of 74099
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