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Displaying 39326 - 39350 of 73697

A Database Design for the Machine Shop Information Model

January 1, 2004
Author(s)
Yung-Tsun Lee, Yan Luo
This report describes a database model currently under development at the Manufacturing System Integration Division (MSID) of the National Institute of Standards and Technology (NIST). The database model contains a set of tables that are mapped onto the

A Low Thermal Error Sampling Comparator for Accurate Settling Measurements

January 1, 2004
Author(s)
David I. Bergman, Bryan C. Waltrip
A new sampling comparator design employing a signal-dependent biasing scheme is described. The dynamic bias significantly reduces signal-induced thermal error in the comparator. The circuit design approach is applicable to comparators intended for use in

A microfabricated atomic clock

January 1, 2004
Author(s)
Svenja A. Knappe, V Shah, Peter D. Schwindt, Leo W. Hollberg, John E. Kitching, Li-Anne Liew, John Moreland

A Multiscale Fabrication Approach to Microfluidic System Development

January 1, 2004
Author(s)
Tony L. Schmitz, John A. Dagata, Brian S. Dutterer, W G. Sawyer
Microfluidic systems for analytical, medical, and sensing applications integrate optical or electrical readouts in low-cost, low-volume consumption systems. Embedding chemically functionalized templates with nanoscale topography within these devices links

A Smart Transducer Interface Standard for Sensors and Actuators

January 1, 2004
Author(s)
Kang B. Lee
A set of common transducer interfaces has been defined in the family of IEEE 1451, standards for connecting sensors and actuators to microprocessors, control and field networks, and instrumentation systems. The standards also defined the Trans-ducer

A Time-Domain SQUID multiplexer for readout of x-ray microcalorimeter arrays

January 1, 2004
Author(s)
W.Bertrand (Randy) Doriese, Jonathan Beall, Joern Beyer, Steven Deiker, S. L. Ferreira, Gene C. Hilton, Kent D. Irwin, John M. Martinis, Sae Woo Nam, Carl D. Reintsema, Joel Ullom, Leila R. Vale
SQUID multiplexers are being developed at NIST for the readout of large arrays of transition-edge-sensor (TES) detectors. Applications for these arrays include x-ray materials analysis on a scanning-electron microscope and astronomical cameras for x-ray

Acoustic Emission Sensors and Their Calibration

January 1, 2004
Author(s)
Donald G. Eitzen, Franklin R. Breckenridge
Noting Item: Request for NOTING- originally published in the Nondestructive Testing Handbook, Second Edition: Vol.5 Acoustic Emission Testing. Columbus, OH : American Society for Nondestructive Testing (1987): p121-134.
Displaying 39326 - 39350 of 73697
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