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The Importance of Distributed Loading and Cantilever Angle in Piezo-Microscopy

Published

Author(s)

B D. Huey, C Ramanujan, M Bobji, J Blendell, Grady S. White, R Szoszkiewicz, A And kulik
Citation
Journal of Electroceramics
Volume
13
Issue
1

Citation

Huey, B. , Ramanujan, C. , Bobji, M. , Blendell, J. , White, G. , Szoszkiewicz, R. and And, A. (2004), The Importance of Distributed Loading and Cantilever Angle in Piezo-Microscopy, Journal of Electroceramics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854238 (Accessed May 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 1, 2004, Updated February 19, 2017