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NIST Authors in Bold

Displaying 39301 - 39325 of 73697

Adiabatic Loading of Bosons Into Optical Lattices

January 16, 2004
Author(s)
P B. Blakie, James V. Porto
We calculate the entropy-temperature curves for non-interacting bosons in a 3D optical lattice and a 2D lattice with transverse harmonic confinement for ranges of depths and filling factors relevant to current experiments. These curves predict regimes

Direct-Current Induced Dynamics in Co 90 Fe 10 /Ni 80 Fe 20 Point Contacts

January 16, 2004
Author(s)
William Rippard, Matthew Pufall, Shehzaad F. Kaka, Stephen E. Russek, Thomas J. Silva
We have directly measured coherent high-frequency magnetization dynamics in ferromagnetic films induced by a spin-polarized dc current. The precision frequency can be tuned over a range of several gigahertz by varying the applied current. The frequencies

Approximating Limit Cycles of a Van der Pol Equation with Delay

January 15, 2004
Author(s)
David E. Gilsinn
In this paper a theorem of Stokes is used to establish the existence of a periodic solution of a Van der Pol equation with fixed delay in the neighborhood of an approximating solution that satisfies a certain noncriticality condition.

Using Nonoscillatory Splines to Model Urban Environments

January 15, 2004
Author(s)
David E. Gilsinn, Marjorie A. McClain, Christoph J. Witzgall
In this paper we introduce the notion of Lavery splines and examine their properties in the univariate case. We also discuss some of the details involved with computing these splines on irregularly spaced data.

NIST-NPL Interlaboratory Pulse Measurement Comparison

January 13, 2004
Author(s)
Nicholas Paulter, A. G. Smith, Donald R. Larson, T. M. Souders, A. G. Roddie
A comparison of the pulse parameter values obtained from the pulse measurement services of the National Institute of Standards and Technology, USA and the National Physical Laboratory, UK was performed. The comparison was based on the pulse parameters of

Bayesian Analysis of Ceria Nanoparticles From Line Profile Data

January 12, 2004
Author(s)
N G. Armstrong, A Dowd, James Cline, W Kalceff
A Bayesian/Maximum entropy (MaxEnt) method is applied to quantify the broadening of X-ray line profiles in terms of the nanocrystallite size effects in ceria. The analysis is in general agreement with transmission electron microscopy results, while

The NIST 3 Megawatt Quantitative Heat Release Rate Facility

January 12, 2004
Author(s)
Rodney A. Bryant, Thomas J. Ohlemiller, Erik L. Johnsson, Anthony P. Hamins, B S. Grove, William F. Guthrie, Alexander Maranghides
The 3 Megawatt Heat Release Rate Facility was developed at NIST as a first step toward having broad capabilities for making quantitative large scale fire measurements. Such capabilities will be used at NIST to validate fire models and to develop sub-grid

From Databooks to Online Dictionaries and Parts Catalogues

January 5, 2004
Author(s)
John V. Messina, James A. St Pierre
This power point presentation was presented at the 4th Annual ECCMA Membership Conference at Lehigh University on October 22nd, 2003 during a panel presentation on competitive sourcing, parts interoperability, and inventory visibility in public sector

In-situ Soft X-ray Studies of Toluene Catalytic Oxidation on the Pt(111) Surface

January 5, 2004
Author(s)
A L. Marsh, D J. Burnette, Daniel A. Fischer, J L. Gland
The catalytic oxidation of toluene on the Pt(111) surface has been characterized, in flowing oxygen pressures up to 1.33 Pa, using fluorescence yield near-edge spectroscopy (FYNES). During temperature-programmed (TP-FYNES) oxidationexperiments in flowing

2003 Information Technology Laboratory (ITL) Technical Accomplishments

January 1, 2004
Author(s)
Elizabeth B. Lennon, Kristi G. Hawes
This report presents the achievements and highlights of NIST's Information Technology Laboratory during FY 2003. Following the Director's Foreword and the ITL overview, technical projects in ITL's research program are described, followed by selected cross

A Database Application for Manufacturing Simulation System Integration

January 1, 2004
Author(s)
Yan Luo, Yung-Tsun Lee
This report describes a database model currently under development at the Manufacturing System Integration Division (MSID) of the National Institute of Standards and Technology (NIST). The database model contains a set of tables that are mapped onto the
Displaying 39301 - 39325 of 73697
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