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Displaying 37901 - 37925 of 73697

Size-Strain Line-Broadening Analysis of the Ceria Round-Robin Sample

December 1, 2004
Author(s)
Davor Balzar, N Audebrand, M R. Daymond, A Fitch, A Hewat, J I. Langford, A Le Bail, D Louer, P Masson, Christopher N. McCowan, N Popa, P W. Stephens, B H. Toby
We report the results of a line-broadening study on a ceria sample prepared for a size-strain round robin. The sample was prepared from a recursor hydrated ceria by heating in a silica crucible at 650 C for 45 hours. Another ceria sample wasprepared to

Standardization of Isotope Ratio Measurements for Doping Control

December 1, 2004
Author(s)
R M. Verkouteren
Pharmaceutical steroids are known to differ in isotopic composition from those produced naturally in the body. By measuring the 13 C/ 12C ratio of specific steroids deteched in urine, the technique of Gas Chromatography-Combustion-Isotope Ratio Mass

The Geometry of Organophosphonates: Fourier-Transform Microwave Spectroscopy and ab Initio Study of Diethyl Methylphosphonate, Diethyl Ethylphosphonate, and Diisopropyl Methylphosphonate

December 1, 2004
Author(s)
R S. DaBell, R D. Suenram, R J. Lavrich, J M. Lochner, M W. Ellzy, K B. Sumpter, J O. Jensen, A C. Samuels
The rotational spectra of diethyl methylphosphonate (DEMP), diethyl ethylphosphonate (DEEP), and diisopropyl methylphosphate (DIMP) have been acquired using Fourier-transform microwave spectroscopy. Spectroscopic constants have been determined for five

The Infrared Spectrum of NH 3/ u - d n u/ Trapped in Solid Neon

December 1, 2004
Author(s)
Marilyn E. Jacox, Warren E. Thompson
The infrared spectra of normal and deuterium-enriched Ne:NH 3u = 1600:1 deposits at 4.3 K have been observed, and structure associated with almost all of the vibrational fundamentals has been assigned. Although the most prominent absorptions arise from the

Traceable Pico-Meter Level Step Height Metrology

December 1, 2004
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Joseph Fu, Theodore V. Vorburger
The atomic force microscope (AFM) increasingly being used as a metrology tool in the semiconductor industry where the features measured are at the nanometer level and continue to decrease. Usually the height sensors of the AFM are calibrated using step

Troubleshooting Key Comparisons

December 1, 2004
Author(s)
Adriana Hornikova, William F. Guthrie
Key Comparisons are international inter-laboratory studies used to establish the degree of equivalence between national measurement standards. These studies, carried out by National Measurement Institutes, are time-consuming, but necessary to facilitate

Uncertainty of the NIST Electrooptic Sampling System

December 1, 2004
Author(s)
Dylan F. Williams, Paul D. Hale, Tracy S. Clement
We present an uncertainty analysis of measurements performed with NIST's electrooptic sampling system. The system measures the voltage waveform injected by a photodetector on a coplanar waveguide fabricated on an electrooptic LiTaO3 wafer. The frequency
Displaying 37901 - 37925 of 73697
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