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Displaying 37651 - 37675 of 73802

Refractive index and birefringence of InGaN films grown by MOCVD

January 1, 2005
Author(s)
Norman Sanford, Anneli Munkholm, Mike A. Krames, Alexander J. Shapiro, Igor Levin, Albert Davydov, Safak Sayan, L Wielunski, T E. Madey
The refractive index and birefringence of InxGa1'xN films grown on GaN layers were measured by prism coupling used in conjunction with multilayer optical waveguide analysis. Samples with x = 0.036, 0.049, 0.060, and 0.066 were examined at the separate

Representation of Acoustic Waves in Unbounded Domains

January 1, 2005
Author(s)
Bradley K. Alpert, Y Chen
Compact, time-harmonic, acoustic sources produce waves that decay too slowly to be square-integrable on a line away from the sources. We introduce an inner product, arising directly from Green s second theorem, to form a Hilbert space of these waves and

RF Behavioural Modelling Using Multisine Excitations

January 1, 2005
Author(s)
Kate Remley, Dominique Schreurs
Large-signal behavioural models for RF devices have historically been based on single- or two-tone data. This type of excitation is often not very representative, as RF devices, being used in telecommunication systems, are usually subjected to modulated

Rich Transcription 2005 Spring Evaluation Website

January 1, 2005
Author(s)
John S. Garofolo
This paper demonstrates that, for large-scale tests, the match and non-match similarity scores have no specific underlying distribution function. The forms of these distribution functions require a nonparametric approach for the analysis of the fingerprint

Scanning Electron Microscope Dimensional Metrology using a Model-based Library

January 1, 2005
Author(s)
John S. Villarrubia, Andras Vladar, Michael T. Postek
The semiconductor electronics industry places significant demands upon secondary electron imaging to obtain dimensional measurements that are used for process control or failure analysis. Tolerances for measurement uncertainty and repeatability are smaller
Displaying 37651 - 37675 of 73802
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