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Displaying 35476 - 35500 of 74256

Enhanced Capabilities of the NIST Fiber Probe for Microfeature Metrology

January 1, 2006
Author(s)
Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup
We have previously reported work in the area of fiber probe development at NIST for micro feature measurement. This probe, which we refer to as the Fiber Deflection Probe, functions by optically imaging the stem from two orthogonal directions a few

Entanglement Purification of Any Stabilizer State

January 1, 2006
Author(s)
Scott Glancy, Emanuel Knill, Hilma M. Vasconcelos
We present a method for multipartite entanglement purification of any stabilizer state shared by several parties. In our protocol each party measures the stabilizer operators of a quantum error correcting code on his or her qubits. The parties exchange

Ethoxylated Bisphenol Dimethacrylate-Based Amorphous Calcium Phosphate Composites

January 1, 2006
Author(s)
Drago Skrtic, Joseph M. Antonucci, D W. Liu
Improving the anti-demineralizing/remineralizing and mechanical properties of amorphous calcium phosphate composites has been the focus of our recent research. In this study an ethoxylated bisphenol A dimethacrylate (EBPADMA) was blended with triethylene

Fiber Deflection Probe for Small Hole Metrology

January 1, 2006
Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
This paper presents the development of a new probing method for Coordinate Measuring Machines (CMM) to inspect diameter and form of small holes. The technique, referred to as fiber deflection probing, can be used for holes of approximately 100 mm nominal

Fiber Deflection Probe Uncertainty Analysis for Micro Holes

January 1, 2006
Author(s)
Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup
We have recently reported on a new probe, the Fiber Deflection Probe (FDP), for diameter and form measurement of large aspect ratio micro-holes (100 um nominal diameter, 5 mm deep). In this paper, we briefly review the measurement principle of the FDP

Final Report of WPEC Subgroup 7

January 1, 2006
Author(s)
S Tagesen, H Vonach, F J. Hambsch, Z Chen, H M. Hofmann, K Shibata, S Y. Oh, S A. Badikov, E V. Gai, V G. Pronyaev, D L. Smith, G M. Hale, T Kawano, Allan D. Carlson, N M. Larson
Displaying 35476 - 35500 of 74256
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