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Displaying 34901 - 34925 of 73839

A Comparison of Thickness Values for Very Thin SiO2 Films by Using Ellipsometric, Capacitance-Voltage and HRTEM Measurements

January 3, 2006
Author(s)
James R. Ehrstein, Curt A. Richter, Deane Chandler-Horowitz, Eric M. Vogel, Chadwin Young, Shweta Shah, Dennis Maher, Brendan C. Foran, Alain C. Diebold
Abstract. A comparison study of very thin SiO2 film thickness values obtained from the three dominant measure-ment techniques used in the Integrated Circuit industry: ellipsometry, capacitance-voltage (C-V) measurements and transmission electron microscopy

Bayesian Alternative to the Guide's Use of the Welch-Satterthwaite Formula

January 3, 2006
Author(s)
Raghu N. Kacker
The Guide to the Expression of Uncertainty in Measurement suggests that to account for the statistical uncertainty in a combined standard uncertainty that arises when one or more of its components are evaluated from a limited number of independent normally

Cryptographic Primitives Can Be Fragile

January 3, 2006
Author(s)
Rene C. Peralta
We show that a well-known coin-flipping protocol is breakable in the sense that one of the parties can pre-determine the result of the coin-flip. The way in which the protocol fails is illustrative of the fact that there are insecure ways of using secure

TRC Thermodynamic Tables - Nonhydrocarbons, Supplement 94, 2005

January 3, 2006
Author(s)
Michael D. Frenkel
1. Table 23-1-a - Page a-1000 Revised table on carbon and carbon oxides containing refractive index, density, boiling point, dT/dP and freezing point. 2. Table 23-2-1-(1.14523)-db - Pages db-5763.0 and db-5736.1 New table for ethyl hexanoate containing the

Ab Initio Calculations of Mean Free Paths and Stopping Powers

January 2, 2006
Author(s)
A P. Sorini, J. Kas, J J. Rehr, M P. Prange, Zachary H. Levine
An approach is presented for theortical calculations of inelastic losses in solids over a broad energy range. The method is based on a many-pole model dielectric function, which is derived from ab initio calculations of optical constants using a real-space

Calibration and Characterization of UV Sensors for Water Disinfection

January 2, 2006
Author(s)
Thomas C. Larason, Yoshihiro Ohno
Ultraviolet radiation (UV) effectively inactivates common pathogens found in ground and surface waters such as Cryptosporidium, Giardia, and most bacterial pathogens (e. g., E. coli). Water treatment facilities recently started using ultraviolet radiation

Field Dependence of the Barrier to Magnetization Reversal of a Stoner-Wohlfarth Particle

January 2, 2006
Author(s)
Edward Della Torre, Lawrence H. Bennett, G Kahler, Roland deWit, R E. Watson
The energy barrier for magnetization reversal, E(sub B), varies quadratically with magnetic field, as is well known. Nonetheless, the energy (enthalpy) required to reverse the magnetization involves E(sub B) plus the work associated with the magnetic field

Microwave Spectrum and Structure of Methyl Phosphonic Difluoride

January 2, 2006
Author(s)
R D. Suenram, Francis J. Lovas, David F. Plusquellic, M W. Elizy, J M. Lochner, J O. Jensen, A C. Samuels
The rotational spectrum of methyl phosphonic difluoride has been reinvestigated using a pulsed-molecular-beam Fabry-Perot cavity microwave spectrometer. The enhanced resolution of the Fourier transform microwave (FTMW) spectrometer (compared to the

Phase-Field Modeling of Solidification Under Stress

January 2, 2006
Author(s)
Julia Slutsker, K Thornton, Alexander Roytburd, James A. Warren, Geoffrey B. McFadden, P W. Voorhees
A phase-field model that includes the stress field during non-isothermal phase transformation of a single-vomponent system has been developed. The model has been applied to the solidification and melting of confined spherical volumes, where sharp interface

Standard Measurement Methods for Materials Properties: Plasticity

January 2, 2006
Author(s)
Richard J. Fields, Sheldon M. Wiederhorn
Plasticity, or permanent deformation, is one of the most useful mechanical properties of materials. It permits forming of parts, and provides a significant degree of safety in use. The ability to specify plastic properties measured by the standard methods

A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers

January 1, 2006
Author(s)
Arvind K. Balijepalli, Thomas W. LeBrun, Satyandra K. Gupta
The optical tweezers instrument is a unique tool for directed assembly of nanocomponents. In order to function as a viable nanomanufacturing tool, a software architecture is needed to run the optical tweezers hardware, provide an effective user interface
Displaying 34901 - 34925 of 73839
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