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Displaying 34551 - 34575 of 73832

AGGRES: A Program for Computing Power Crusts of Aggregates

April 3, 2006
Author(s)
Javier Bernal
AGGRES, a Fortran 77 program for computing a power crust of an aggregate, is discussed. AGGRES takes a finite set of points from the surface of an aggregate, i.e. a three-dimensional object with no holes that contains its center of mass in its interior

Elastodynamic characterization of imprinted nanolines

April 3, 2006
Author(s)
Ward L. Johnson, Colm Flannery, Sudook A. Kim, Roy H. Geiss, Christopher Soles, Paul R. Heyliger
Experimental techniques employing Brillouin light scattering (BLS) and analytical techniques employing finite-element (FE) and Farnell-Adler models are being developed for characterizing acoustic modes and determining elastic moduli and dimensions of

Engineered Infills for Concrete Barriers

April 3, 2006
Author(s)
Kenneth A. Snyder, C Langton, B Clark, Chiara C. Ferraris, J Dawson
Entombment may be considered as an option for decommissioning nuclear concrete structures so that licenses for facilities on which these structures reside may be terminated. Prior to entombment, the nuclear facility permanently ceases operations and spent

Forensic Software Tools for Cell Phone Subscriber Identity Modules

April 3, 2006
Author(s)
Wayne Jansen, Richard Ayers
Cell phones and other handheld devices incorporating cell phone capabilities (e.g., smart phones) are ubiquitous. Besides placing calls, cell phones allow users to perform other tasks such as text messaging and phonebook entry management. When cell phones

International Comparison of Impact Reference Materials (2004)

April 3, 2006
Author(s)
Christopher N. McCowan, G. Roebben, Y. Yamaguchi, S. Lefrancois, Jolene D. Splett, S. Takagi, A. Lamberty
A three-year horizontal comparison has been completed between national laboratories that certify specimens for the indirect verification of Charpy impact test machines. The participants in this study were the Institute for Reference Materials and

Standardized Equation for Hydrogen Gas Densities for Fuel Consumption Applications

April 3, 2006
Author(s)
Eric Lemmon, Marcia L. Huber, Daniel G. Friend, Carl Paulina
One of three currently recognized methods for evaluating the consumption of gaseous hydrogen fuel in vehicle applications involves the determination of the equilibrium temperature and pressure of the gas before and after usage within a storage tank of

A Summary of Lightpipe Radiation Thermometry Research at NIST

April 1, 2006
Author(s)
Benjamin K. Tsai
During the last ten years, research in lightpipe radiation thermometry has significantly reduced the uncertainties for temperature measurements in semiconductor processing. The National Institute of Standards and Technology (NIST) has improved the

A Wireless Environmental Monitoring System Based on the IEEE 1451.1 Standard

April 1, 2006
Author(s)
Kang B. Lee, Yuyin Song
This paper describes a wireless environmental monitoring system developed at the National Institute of Standards and Technology (NIST) based on the Institute of Electrical and Electronics Engineers (IEEE) 1451.1 standard using the Unified Modeling Language

Autonomous System (AS) Isolation under Randomized BGP Session Attacks with RFD Exploitation

April 1, 2006
Author(s)
Kotikalapudi Sriram, Douglas Montgomery, Oliver Borchert, Okhee Kim, D. Richard Kuhn
BGP peering session attacks are known to drive routes into route flap damping (RFD) suppression states and thus cause isolations between autonomous systems (ASes) and destinations. We present a detailed study of the impact of BGP peering session attacks

Characterization of an Optical Time Domain Reflectometer Calibrator

April 1, 2006
Author(s)
Donald R. Larson, Nicholas Paulter, Kenneth C. Blaney
We report the results of an investigation into the signal characteristics and behavior of an instrument used by the US Air Force Metrology and Calibration Program to calibrate optical time domain reflectometers. The instrument is calibrated using NIST

Composition Standards for AlGaAs Epitaxial Layers

April 1, 2006
Author(s)
Kristine A. Bertness, Todd E. Harvey, C. M. Wang, Albert J. Paul, Larry Robins
Standard Reference Materials (SRMs) 2840 to 2843 are semiconductor material artifacts that consist of an epitaxial layer of AlxGa (1-x)As on a GaAs substrate. From the energy at the peak intensity in the photoluminescence (PL) spectrum, the composition of

Cryptographic Hash Standards ? Where Do We Go From Here?

April 1, 2006
Author(s)
William E. Burr
The two most commonly used cryptographic hash functions, MD5 and SHA-1, have been successfully attacked?it is no longer advisable to use them in some applications, although other applications are not affected. Furthermore, these attacks have triggered a

Design and Fabrication of a Copper Test Structure as a Electrical Critical Dimension Reference

April 1, 2006
Author(s)
Byron J. Shulver, Andrew S. Bunting, Alan Gundlach, Les I. Haworth, Alan W. Ross, Anthony J. Snell, J. T. Stevenson, Anthony Walton, Richard A. Allen, Michael W. Cresswell
A novel copper damascene process is reported for the implementation of Electrical Critical Dimension (ECD) reference material. The method of fabrication first creates an initial 'silicon preform' whose linewidth is transfered into a trench using a silicon
Displaying 34551 - 34575 of 73832
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