U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 33626 - 33650 of 74165

Report of the Workshop on Reliability Issues in Nanomaterials

January 1, 2007
Author(s)
Robert Keller, David T. Read, Roop L. Mahajan
The Workshop on Reliability Issues in Nanomaterials was held at the Boulder Laboratories of the U. S. Department of Commerce on August 17-19, 2004. It was organized by the National Institute of Standards and Technology (NIST) and was designed to promote a

Results of a Nanoindentation Round Robin on Thin Film Copper on Silicon

January 1, 2007
Author(s)
David T. Read, Robert Keller, Nicholas Barbosa, Roy H. Geiss
Nanoindentation is used in a variety of fields to measure material hardness and elastic modulus. This test technique is especially attractive for thin films because of the difficulty of conducting tensile or other conventional mechanical characterization

Rheology of Concentrated Carbon Nanotube Suspensions

January 1, 2007
Author(s)
K HobbieE, J FryD
The rheological properties of non-Brownian carbon nanotube suspensions are measured over a range of nanotube volume fractions spanning the transition from semi-dilute to concentrated. The nanotubes are `sticky' and form a quiescent elastic network with a

Roundness Measurements Using the NIST Fiber Probe

January 1, 2007
Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
We have described a fiber probe for dimensional measurement of micro-holes in the 2004 and 2006 ASPE annual meetings. In this abstract, we describe the adaptation of this probe for measuring roundness of tiny holes and knife edge apertures. In its current

SEMPA Imaging for Spintronics Applications

January 1, 2007
Author(s)
John Unguris, Daniel T. Pierce, Seok-Hwan Chung
Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by

Spin-Orbit Precession Damping in Transition Metal Ferromagnets

January 1, 2007
Author(s)
Keith Gilmore, Y Idzerda, Mark D. Stiles
We provide a simple explanation, based on an effective field, for the precession damping rate due to the spin-orbit interaction. Previous effective field treatments of spin-orbit damping include only variations of the state energies with respect to the
Displaying 33626 - 33650 of 74165
Was this page helpful?