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Displaying 31901 - 31925 of 73829

Object-oriented Model for IEEE 1588 Standard

October 1, 2007
Author(s)
Kang B. Lee, Eugene Song
The IEEE 1588 standard specifies a protocol enabling precise synchronization of clocks in measurement and control systems implemented with technologies such as network communication, local computing, and distributed objects. This paper describes an object

Optical-to-microwave frequency comparison with fractional uncertainty of 10 -15

October 1, 2007
Author(s)
Jason Stalnaker, Scott A. Diddams, Tara M. Fortier, K Kim, Leo W. Hollberg, James C. Bergquist, Wayne M. Itano, Marie Delaney, Luca Lorini, Windell Oskay, Thomas P. Heavner, Steven R. Jefferts, Filippo Levi, Thomas E. Parker, Jon H. Shirley
We report the technical aspects of the optical-to-microwave comparison for our recent measurements of the optical frequency of the mercury single-ion frequency standard in terms of the SI second as realized by the NIST-F1 cesium fountain clock. Over the

Photomask Applications of Traceable Atomic Force Microscope Dimensional Metrology at NIST

October 1, 2007
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, James E. Potzick, Joseph Fu, Michael W. Cresswell, Richard A. Allen, S J. Smith, Anthony J. Walton
The National Institute of Standards and Technology (NIST) has a multifaceted program in AFM dimensional metrology. Two major instruments are being used for traceable measurements. The first is a custom in-house metrology AFM, called the calibrated AFM (C

Photon-number-discriminating detection using a quantum-dot, optically gated, field-effect transistor

October 1, 2007
Author(s)
Eric Gansen, Mary A. Rowe, M. Greene, Danna Rosenberg, Todd E. Harvey, Mark Su, Robert Hadfield, Sae Woo Nam, Richard Mirin
Detectors with the capability to directly measure the photon number of a pulse of light 1-3 enable linear optics quantum computing 4, affect the security of quantum communications 5, and can be used to characterize 6-8 and herald 9 non-classical states of

Raman Spectroscopy of n-Type and p-Type GaSb with Multiple Excitation Wavelengths

October 1, 2007
Author(s)
James E. Maslar, Wilbur S. Hurst, C Wang
The interpretation of Raman spectra of GaSb can be complicated by the presence of a so-called surface space-charge region (SSCR), resulting in an inhomogeneous near-surface Raman scattering environment. To fully interpret Raman spectra, it is important to

Reference Material for Assessing Forensic SIM Tools

October 1, 2007
Author(s)
Wayne Jansen, Aurelien M. Delaitre
Subscriber Identity Modules (SIMs) are a fundamental standardized component of most cell phones used worldwide. A SIM can be removed from a phone handset and inserted into another, allowing users to port identity, personal information, and service between

Reproducibility of the Accommodation Coefficient of the Spinning Rotor Gauge

October 1, 2007
Author(s)
Ren F. Chang, Patrick J. Abbott
Eight spinning rotor gauges were calibrated numerous times simultaneously with the primary midrange vacuum standard at the National Institute of Standards and Technology, over a period of fifteen months to assess the reproducibility of their accommodation

Simultaneous Determination of Inorganic Mercury, Methylmercury, and Total Mercury Concentrations in Cryogenic Fresh-Frozen and Freeze-dried Biological Reference Materials

October 1, 2007
Author(s)
David Point, William C. Davis, J. I. Garcia Alonso, Mathilde Monperrus, Steven J. Christopher, O.F. X. Donard, Paul R. Becker, Stephen A. Wise
A double spike speciated isotope dilution (DS-SID) reaction model was developed to study and correct for the inadvertent transformations affecting methylmercury (MeHg), inorganic mercury (iHg) and total mercury (HgT) measurements in biological tissues

Validation of Novel Optical Imaging Modalities: The Pathologists' View

October 1, 2007
Author(s)
W Wells, Peter E. Barker, C Macaulay, M Novelli, Richard Levenson, J Crawford
Recent advances in optical imaging technology have the potential to improve the accuracy of disease detection and predict treatment response. The critical end-point for the success of any new imaging technology is clinical outcome. The following review

CD Reference Materials Fabricated on Monolithic 200 mm Wafers for Automated Metrology Tool Applications

September 30, 2007
Author(s)
Richard A. Allen, Ronald G. Dixson, Michael W. Cresswell, William Gutherie, Byron J. Shulver, Andrew S. Bunting, J. T. Stevenson, Anthony Walton
Recently, prototype isolated-line, single-crystal CD reference materials (SCCDRMs) with linewidths as narrow as 40 nm ? 1.5 nm have been reported. These reference materials, designated NIST Reference Material (RM) 8111 were configured as a 10 mm by 11 mm

Characterization of Electrically Active Defects in High-K Gate Dielectrics By Using Low Frequency Noise, Charge Pumping, and Fast Id-Vg measurements

September 30, 2007
Author(s)
Hao Xiong, Dawei Heh, Moshe Gurfinkel, Qiliang Li, Yoram Shapira, Curt A. Richter, Gennadi Bersuker, Choi Rino, John S. Suehle
The electrically active defects in High-k/SiO2 dielectric stacks are examined using a combination of low frequency noise (LFN), charge pumping (CP), and ultra fast Id-Vg methods. The volume trap profile in the stacks is obtained by modeling the drain
Displaying 31901 - 31925 of 73829
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