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NIST Authors in Bold

Displaying 301 - 325 of 829

Spectrometer stray light can bias retrievals of solar-induced fluorescence

May 14, 2019
Author(s)
Loren Albert, Katherine Cushman, Yuqin Zong, David Allen, Luis Alonso, James Kellner
Remote sensing of solar induced chlorophyll fluorescence (SIF) promises a significant advance in our ability to quantify gross primary productivity across spatial scales. Because the fluorescence emission is usually 5 % of recorded canopy radiance

A Reference Schema for the Unit Manufacturing Process Information Model

May 7, 2019
Author(s)
William Bernstein, David Lechevalier
This document presents supporting documentation for a reference implementation of the Unit Manufacturing Process (UMP) information model presented in ASTM E3012, Standard Guide for Characterizing Environmental Aspects of Manufacturing Processes. A version

Incorporating unit manufacturing process models into life cycle assessment workflows

May 5, 2019
Author(s)
William Z. Bernstein, Cesar D. Tamayo, David Lechevalier, Michael Brundage
Life cycle assessment (LCA) carries significant uncertainties and imprecision due to a number of factors, including the framework's linearity assumptions and the wide use of aggregate unit processes in practice. The goal of this work is to exploit the unit

Standards Needs for Maintenance Work Order Analysis in Manufacturing

April 3, 2019
Author(s)
Thurston Sexton, Michael Brundage
To bolster the efficiency and performance of maintenance work in manufacturing-maintenance being one of the key components to ensuring successful long-term operations-it is becoming increasingly necessary to ensure that maintenance operations are capable

An open resource for accurately benchmarking small variant and reference calls

April 1, 2019
Author(s)
Justin M. Zook, Jennifer H. McDaniel, Marc L. Salit, Nathanael D. Olson, Justin M. Wagner
Benchmark small variant calls are required for developing, optimizing and assessing the performance of sequencing and bioinformatics methods. Here, as part of the Genome in a Bottle (GIAB) Consortium, we apply a reproducible, cloud-based pipeline to

NIST Handbook 150-1, NVLAP Energy Efficient Lighting Products

February 14, 2019
Author(s)
C Cameron Miller, Timothy Rasinski
NIST Handbook 150-1, NVLAP Energy Efficient Lighting Products, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Energy Efficient Lighting Products LAP. The 2018 revision aligns this handbook with the

NIST Micronutrients Measurement Quality Assurance Program: 1984-1985 Comparability Studies Results for Round Robins I, II, III and V Fat Soluble Vitamins and Carotenoids in Human Serum

February 8, 2019
Author(s)
Jeanice M. Brown Thomas, David L. Duewer, Margaret C. Kline, William A. MacCrehan, Robert Paule, Reenie Parris, Willie May, Robert Schaffer
From 1984 to 2017, the National Institute of Standards and Technology (NIST) and its precursor the National Burearu of Standards (NBS) coordinated what became the Micronutrients Measurement Quality Assurance Program (MMQAP) for laboratories that measure

Proceedings of the First Workshop on Standards for Microfluidics

January 28, 2019
Author(s)
Darwin R. Reyes-Hernandez, Henne van Heeren
In the last two decades, the microfluidics/lab-on-a-chip field has evolved from the concept of micro total analysis systems, where systems with integrated pretreatment and analysis of chemicals were envisioned, to what is known today as lab-on-a-chip

NIST Nanotechnology Environmental, Health, and Safety Research Program: 20092016

November 27, 2018
Author(s)
Debra L. Kaiser, Vincent A. Hackley
In response to needs of a government-wide initiative in nanotechnology led by a subcommittee within the White House’s Office of Science and Technology Policy, NIST established a nanotechnology environmental, health, and safety (nano-EHS) research program

Predictive Model Markup Language (PMML) Representation of Bayesian Networks: An Application in Manufacturing

October 2, 2018
Author(s)
Saideep Nannapaneni, Anantha Narayanan Narayanan, Ronay Ak, David Lechevalier, Thurston Sexton, Sankaran Mahadevan, Yung-Tsun Lee
Bayesian networks (BNs) represent a promising approach for the aggregation of multiple uncertainty sources in manufacturing networks and other engineering systems for the purposes of uncertainty quantification, risk analysis, and quality control. A

Spherical Test Objects for Hand-held Metal Detector Characterization

September 12, 2018
Author(s)
Nicholas G. Paulter Jr., Donald R. Larson, John A. Ely
Measuring the detection performance of metal detectors (hand-worn, hand-held, and walk-through models) is based on the observation of an alarm indication (light, sound, vibration) given by the metal detector when a threat or test object is present. These

The Industrial Ontologies Foundry Proof-of-Concept Project

August 26, 2018
Author(s)
Boonserm Kulvatunyou, Evan K. Wallace, Dimitris Kiritsis, Barry Smith, Chris Will
The current industrial revolution is said to be driven by the digitization of manu-facturing that exploits connected information across all aspects of manufacturing. Standards have been recognized as an important enabler. Ontology is the next generation

A reference high-pressure CO2 adsorption isotherm for ammonium ZSM-5 zeolite: results of an interlaboratory study

July 26, 2018
Author(s)
Huong Giang T. Nguyen, Laura Espinal, Roger D. van Zee, Matthias Thommes, Blaza Toman, Sterlin Hudson, Enzo Mangano, Stefano Brandani, Katie Cychosz, Pieter Bertier, Feng Yang, Bernhard Krooss, Rebecca Siegelman, Jeffrey Long, Yoko Nakada, Kazu Nakai, Armin Ebner, James Ritter, Aaron Moran, Orhan Talu, Yi Huang, Krista Walton, Pierre Billemont, Guy de Weireld
This paper reports the results of an international interlaboratory study led by the National Institute of Standards and Technology (NIST) on the measurement of high-pressure surface excess carbon dioxide adsorption isotherms on NIST Reference Material RM

10 T? and 100 T? Resistance Comparison between NIST and AIST

July 9, 2018
Author(s)
Dean G. Jarrett, Takehiko Oe, Nobu Kaneko, Shamith U. Payagala
We report the results of a comparison of 10 TΩ and 100 TΩ high resistance standards between the National Institute of Standards and Technology (NIST) and the National Institute for Advanced Industrial Science and Technology (AIST). Three standard resistors

Transport of NIST Graphene Quantized Hall Devices and Comparison with AIST Gallium-Arsenide Quantized Hall Devices

July 9, 2018
Author(s)
Dean G. Jarrett, Takehiko Oe, Randolph E. Elmquist, Nobu Kaneko, Albert F. Rigosi, Bi Y. Wu, Hsin Y. Lee, Yanfei Yang
We report the results of a pilot study where two graphene quantized Hall resistance (QHR) devices made at the National Institute of Standards and Technology (NIST) were hand carried from the USA to the National Institute for Advanced Industrial Science and

Measurement of Leakage Current to Ground in Programmable Josephson Voltage Standard

July 8, 2018
Author(s)
Alain Rufenacht, Charles J. Burroughs, Paul D. Dresselhaus, Samuel P. Benz
The voltage error associated with the leakage current of programmable Josephson voltage standards (PJVS) is one of the largest contributions to the uncertainty in direct comparison of voltage standards. Due to the parallel biasing scheme of the PJVS and
Displaying 301 - 325 of 829
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