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NIST Authors in Bold

Displaying 25951 - 25975 of 73697

Defect depth profiling in gate dielectrics

September 29, 2010
Author(s)
Kin P. Cheung
Defects in gate dielectric greatly impact the performance and reliability of advanced MOSFETs. The introduction of high-k/metal gate technology makes the characterization of defects much more important and urgent. There are a limited number of methods

Contactless Approaches for RF Characterization of Metallic Nanowires

September 28, 2010
Author(s)
Kichul Kim, Paul Rice, Thomas M. Wallis, SangHyun S. Lim, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Dejan Filipovic
Two approaches for microwave characterization of nanowire (NW) conductivity are described in this paper. To remove the uncertainty associated with contacts, the NWs are either suspended above the center conductor of a coplanar waveguide (CPW) host or

Evaluation of Ultra-Wideband Technology for use in 3D Locating Systems

September 28, 2010
Author(s)
Adam P. Kopp, Kamel S. Saidi, Hiam Khoury
A high-powered (5 Watt peak power) ultra-wideband (UWB) ranging system was evaluated for use as the basis for a 3-Dimensional (3D) locating system by comparing tracking results to a ground truth system. The UWB ranging system is composed of five ranging

Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements

September 28, 2010
Author(s)
Arkadiusz C. Lewandowski, Dylan F. Williams, Wojciech Wiatr
We present a multi-frequency approach to vector-network-analyzer scattering-parameter measurements. This novel approach accounts for the relationships between the measurements at different frequencies, and thus breaks with the traditional paradigm to

Seeking Science and Technology

September 28, 2010
Author(s)
Stacy M. Bruss, Keith R. Martin
Although not everyone can be a sci-tech information specialist, science, technology, and medicine (STM) tends to overlap with other research agendas. This session will start with a general overview of science and technology websites. It will then focus on

A DS-CDMA Interference Cancellation Technique for Body Area Networks

September 27, 2010
Author(s)
Wen-Bin Yang, Kamran Sayrafian
A low complexity Parallel Interference Cancellation (PIC) technique that is applicable to body area networks is presented. Using Direct-Sequence Code Division Multiple Access (DS-CDMA), the technique aims at suppressing interference caused by rapid changes

Fatigue Pre-Cracking Curved Wide Plates in Bending

September 27, 2010
Author(s)
Mark D. Richards, Timothy S. Weeks, Joseph D. McColskey, Bo Wang, Yong-Yi Wang
In support of using high strength steels for strain-based design of pipeline, curved wide plate (CWP) tests in tension are being performed on API 5L X100 pipes of 36-inch (916-mm) diameter and 0.75-inch (19-mm) wall thickness. The CWP tests are being used

MEASUREMENT OF CTOA OF PIPE STEELS USING MDCB AND DWTT SPECIMENS

September 27, 2010
Author(s)
Christopher N. McCowan, S. Xu, W. R. Tyson, R. Eagleson, Elizabeth S. Drexler, J. D. McColskey, Philippe P. Darcis
Two types of specimen for crack tip opening angle (CTOA)measurement have been investigated for pipeline applications,i.e., the modified double cantilever beam (MDCB) (at NIST)and the drop-weight tear test (DWTT) specimen (at CANMET). Results of effects of

Revised interpretation of the Na I EUV absorption spectrum

September 27, 2010
Author(s)
Alexander Kramida
Spectral data for neutral sodium were recently compiled by Sansonetti (2008 J. Phys. Chem. Ref. Data 37 1659). In that compilation, some of the energy levels of the 2p53snl configurations were quoted from the studies of the absorption spectrum in the

SE(T) Testing of Pipeline Welds

September 27, 2010
Author(s)
Elizabeth S. Drexler, Yong-Yi Wang, Jeffrey W. Sowards, Marc Dvorak
Single edge-notch tension (referred to as SE(T) or SENT) tests are increasingly being used in the pipeline community, as they are a laboratory-scale fracture toughness test, capable of being performed on linepipe steels and welds. The constraint and
Displaying 25951 - 25975 of 73697
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