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Displaying 25351 - 25375 of 73878

Black-Body Radiation Correction in the Polarizability of Helium

March 1, 2011
Author(s)
Peter J. Mohr, M. Puchalski, Ulrich D. Jentschura
The correction to the polarizability of helium due to black-body radiation is calculated near room temperature. A precise theoretical determination of the black-body radiation correction to the polarizability of helium is essential for dielectric gas

Efficient Motion Vector Interpolation for Error Concealment of H.264/AVC

March 1, 2011
Author(s)
Hamid Gharavi
In video communications the compressed video stream is very likely to be corrupted by channel errors. In order to combat these channel errors, many methods have been proposed. In this paper, a new method for motion vectors (MVs) interpolation with the help

Geometric effects when measuring small holes with micro contact probes.

March 1, 2011
Author(s)
Jack A. Stone Jr., Balasubramanian Muralikrishnan, Chittaranjan Sahay
A coordinate measuring machine with a suitably small probe can be used to measure micro-features such as the diameter and form of small holes (often about 100 micrometers in diameter). When measuring small holes, the clearance between the probe tip and the

High Pressure Release and Dispersion of Hydrogen in a Partially Enclosed Compartment

March 1, 2011
Author(s)
Kuldeep R. Prasad, Thomas G. Cleary, William M. Pitts, Jiann C. Yang
The study of compressed hydrogen release from high-pressure storage systems has practical application for hydrogen and fuel cell technologies. Such releases may occur either due to accidental damage to a storage tank or connecting piping, or direct PRD

Nanoelectronics Lithography

March 1, 2011
Author(s)
Stephen Knight, Vivek Prabhu, John H. Burnett, James Alexander Liddle, Christopher Soles, Alain C. Diebold
This is a compiled chapter that will be included into the Handbook of Nanophysics.

The SIM Time Network

March 1, 2011
Author(s)
Michael A. Lombardi, Andrew N. Novick, J. Mauricio Lopez-Romero, Francisco Jimenez, Eduardo de Carlos Lopez, Jean-Simon Boulanger, Raymond Pelletier, Ricardo de Carvalho, Raul Solis, Harold Sanchez, Carlos A. Quevedo, Gregory Pascoe, Daniel Perez, Eduardo Bances, Leonardo Trigo, Victor Masil, Henry Postigo, Anthony Questelles
The Sistema Interamericano de Metrologia (SIM) is a regional metrology organization (RMO) whose members are the national metrology institutes (NMIs) located in the 34 nations of the Organization of American States (OAS). The SIM/OAS region extends

Thermal Correction to the Molar Polarizability of a Boltzmann Gas (Brief Report)

March 1, 2011
Author(s)
Ulrich D. Jentschura, M. Puchalski, Peter Mohr
The metrology of fundamental quantities in atomic physics has been crucial for a number of advanced determinations of fundamental constants. In addition to very accurate frequency measurements, the molar polarizability of atomic gases has recently been

Model Checking for Verification of Mandatory Access Control Models and Properties

February 28, 2011
Author(s)
Chung Tong Hu, David R. Kuhn, Tao Xie, J Hwang
Mandatory access control (MAC) mechanisms control which users or processes have access to which resources in a system. MAC policies are increasingly specified to facilitate managing and maintaining access control. However, the correct specification of the

NIST SP 500-268, Source Code Security Analysis Tool Function Specification Version 1.1

February 28, 2011
Author(s)
Elizabeth N. Fong, Paul E. Black, Michael J. Kass, Hsiao-Ming M. Koo
Software assurance tools are a fundamental resource to improve assurance in today's software applications. Some tools analyze software requirements or design models to help determine if an application is secure. Others analyze source code or executables
Displaying 25351 - 25375 of 73878
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