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Displaying 2526 - 2550 of 143816

2022 NIST Summary of U.S. Legal Metrology Activities

June 20, 2023
Author(s)
Lisa Warfield, Tina G. Butcher, Richard A. Harshman, Jan Konijnenburg, Gloria Diane Lee, David Sefcik, Juana Williams, Katrice Lippa
The NIST Office of Weights and Measures (OWM) presents its first report 2022 NIST Annual Summary of U.S. Legal Metrology Activities report. This report includes a summary of changes made to NIST Handbook 44 (2021) Specifications, Tolerances and Other

Procedure Overhaul at the NIST Center for Neutron Research

June 19, 2023
Author(s)
Brandy Frie, David Griffin, James R. Whipple
The National Institute of Standards and Technology (NIST) Center for Neutron Research operates a 20 MW research reactor whose primary purpose is to produce cold neutrons for material sciences experiments. On February 3rd, 2021, a fuel element was unlatched

What limits the voltage of GaAs photovoltaic devices under low indoor light?

June 19, 2023
Author(s)
Behrang Hamadani, Margaret Stevens, Matthew Lumb, Kenneth Schmieder
The external radiative efficiency of a photovoltaic device is a useful metric to compare different photovoltaic technologies and material systems. However, under low-intensity indoor lighting, a particular open-circuit voltage dependence arises that cannot

Alternative Reflectors for The NIST Neutron Source

June 18, 2023
Author(s)
Yaniv Shaposhnik, Osman Celikten, Jeremy Cook, Abdullah Weiss, Dagistan Sahin
A conceptual design of a replacement reactor at the NIST Center for Neutron Research (NCNR), referred to as the NIST Neutron Source (NNS), is underway in collaboration with the Brookhaven National Laboratory. The NNS reactor design favors the production of

Lessons Learned on NBSR Licensing Actions

June 18, 2023
Author(s)
Dagistan Sahin, Thomas H. Newton, Steven Dewey, Osman Celikten, Paul C. Brand, Lap-Yan Cheng
After the incident in February 2021, NBSR implemented three license amendment requests (LAR) to allow the restart of the reactor. The first LAR was to modify previous latch verification requirements in the Technical Specifications (TS). Originally TS

A non-defect precursor gate oxide breakdown model

June 16, 2023
Author(s)
Kin (Charles) Cheung
Understanding defect creation is central to efforts to comprehend gate dielectric breakdown in metal-oxide-semiconductor-field-effect-transistors (MOSFETs). While gate dielectrics other than SiO2 are now popular, models develop for SiO2 breakdown are used

Status Report on the Final Round of the NIST Lightweight Cryptography Standardization Process

June 16, 2023
Author(s)
Meltem Sonmez Turan, Kerry McKay, Donghoon Chang, Jinkeon Kang, Noah Waller, John M. Kelsey, Lawrence E. Bassham, Deukjo Hong
The National Institute of Standards and Technology (NIST) initiated a public standardization process to select one or more Authenticated Encryption with Associated Data (AEAD) and hashing schemes suitable for constrained environments. In February 2019, 57

DATA REQUIREMENTS FOR DIGITAL TWINS IN ADDITIVE MANUFACTURING

June 15, 2023
Author(s)
Shaw C. Feng, Albert T. Jones, Guodong Shao
The number and types of sensors used to monitor additive manufacturing (AM) processes and parts in real time are growing. The emerging digital twins (DTs) associated with the data collected by those sensors and the functions that use that data as inputs
Displaying 2526 - 2550 of 143816
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