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NIST Authors in Bold

Displaying 25176 - 25200 of 73697

Geometric effects when measuring small holes with micro contact probes.

March 1, 2011
Author(s)
Jack A. Stone Jr., Balasubramanian Muralikrishnan, Chittaranjan Sahay
A coordinate measuring machine with a suitably small probe can be used to measure micro-features such as the diameter and form of small holes (often about 100 micrometers in diameter). When measuring small holes, the clearance between the probe tip and the

High Pressure Release and Dispersion of Hydrogen in a Partially Enclosed Compartment

March 1, 2011
Author(s)
Kuldeep R. Prasad, Thomas G. Cleary, William M. Pitts, Jiann C. Yang
The study of compressed hydrogen release from high-pressure storage systems has practical application for hydrogen and fuel cell technologies. Such releases may occur either due to accidental damage to a storage tank or connecting piping, or direct PRD

Nanoelectronics Lithography

March 1, 2011
Author(s)
Stephen Knight, Vivek Prabhu, John H. Burnett, James Alexander Liddle, Christopher Soles, Alain C. Diebold
This is a compiled chapter that will be included into the Handbook of Nanophysics.

The SIM Time Network

March 1, 2011
Author(s)
Michael A. Lombardi, Andrew N. Novick, J. Mauricio Lopez-Romero, Francisco Jimenez, Eduardo de Carlos Lopez, Jean-Simon Boulanger, Raymond Pelletier, Ricardo de Carvalho, Raul Solis, Harold Sanchez, Carlos A. Quevedo, Gregory Pascoe, Daniel Perez, Eduardo Bances, Leonardo Trigo, Victor Masil, Henry Postigo, Anthony Questelles
The Sistema Interamericano de Metrologia (SIM) is a regional metrology organization (RMO) whose members are the national metrology institutes (NMIs) located in the 34 nations of the Organization of American States (OAS). The SIM/OAS region extends

Thermal Correction to the Molar Polarizability of a Boltzmann Gas (Brief Report)

March 1, 2011
Author(s)
Ulrich D. Jentschura, M. Puchalski, Peter Mohr
The metrology of fundamental quantities in atomic physics has been crucial for a number of advanced determinations of fundamental constants. In addition to very accurate frequency measurements, the molar polarizability of atomic gases has recently been

Model Checking for Verification of Mandatory Access Control Models and Properties

February 28, 2011
Author(s)
Chung Tong Hu, David R. Kuhn, Tao Xie, J Hwang
Mandatory access control (MAC) mechanisms control which users or processes have access to which resources in a system. MAC policies are increasingly specified to facilitate managing and maintaining access control. However, the correct specification of the

NIST SP 500-268, Source Code Security Analysis Tool Function Specification Version 1.1

February 28, 2011
Author(s)
Elizabeth N. Fong, Paul E. Black, Michael J. Kass, Hsiao-Ming M. Koo
Software assurance tools are a fundamental resource to improve assurance in today's software applications. Some tools analyze software requirements or design models to help determine if an application is secure. Others analyze source code or executables

Photon antibunching from a single lithographically defined InGaAs/GaAs quantum dot

February 28, 2011
Author(s)
Varun B. Verma, Martin J. Stevens, Kevin L. Silverman, Neville Dias, Akash Garg, James J. Coleman, Richard P. Mirin
We demonstrate photon antibunching from a single lithographically defined quantum dot fabricated by electron beam lithography, wet chemical etching, and overgrowth of the barrier layers by metalorganic chemical vapor deposition. Measurement of the second

Real-time polarization microscopy for probing local distributions of biomolecules

February 28, 2011
Author(s)
Jeeseong Hwang, Ji Y. Lee, John F. Lesoine, Hyeong G. Kang, Matthew L. Clarke, Robert C. Chang
We present real-time, full-field, fluorescence polarization microscopy and its calibration and validation methods to monitor the absorption dipole orientation of fluorescent molecules. A quarter-wave plate, in combination with a liquid crystal variable
Displaying 25176 - 25200 of 73697
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