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Displaying 43176 - 43200 of 74506

Solvophobically Driven Self-Assembly of Chiral Supramolecular Dendrimers

December 1, 2002
Author(s)
Virgil Percec, A E. Dulcey, Y Miura, U Edlund, V S. Balagurusamy, Steven Hudson, H Duan, Paul A. Heiney
The self assembly in dilute solution of chiral supramolecular dendrimers is investigated by circular dichroism (CD) spectroscopy. These results are compared with analysis of the bulk state by CD spectroscopy x-ray diffraction electron diffraction and

Spectral Responsivity Determination of a Transfer-Standard Pyroelectric Radiometer

December 1, 2002
Author(s)
George P. Eppeldauer, J Racz, Leonard M. Hanssen
A NIST-Developed pryoelectric radiometer was characterized and calibrated to extend the NIST high accuracy spectral responsively scale from the visible range to the ultraviolet (UV) and infrared (IR). The transmission of the gold-black coated LiNbO 3

Superconformal Electrodeposition Using Derivitized Substrates

December 1, 2002
Author(s)
Thomas P. Moffat, Daniel Wheeler, C Witt, Daniel Josell
This paper demonstrates superconformal electrodeposition of copper in trenches using a two step process. The substrate is first derivitized with a submonolayer coverage of catalyst and then transferred for electroplating in a cupric sulfate electrolyte

Thermodynamic Quantities for the Ionization Reactions of Buffers in Water

December 1, 2002
Author(s)
Robert N. Goldberg, N Kishore, R M. Lennen
This table contains selected values for the pK, standard molar enthalpy of reaction {Δ} rH , and standard molar heat-capacity change {Δ} rC p for the ionization reactions of 64 buffers many of which are relevant to biochemistry and to biology. The values

Universal Scaling of Ballistic Magnetoresistance in Magnetic Nanocontacts

December 1, 2002
Author(s)
S Chung, M Munoz, N Garcia, William F. Egelhoff Jr., Romel Gomez
This paper shows that ballistic magnetoresistance has a universal behavior versus scaled conductance in atomic or nanometer size contacts. New results are presented for half-metallic ferromagnets forming contacts of CrO 2-CrO 2 and CrO 2-Ni that show as

X-Ray Spectroscopy of Trapped Ions With a Microcalorimeter on the NIST Electron Beam Ion Trap

December 1, 2002
Author(s)
E Takacs, John D. Gillaspy, L P. Ratliff, K Makonyi, J M. Laming, E Silver, H. Schnopper, M Barbera, J. Beeman, E. E. Haller, N. Madden
The electron beam ion trap (EBIT) was invented about 15 years ago. Judging from the wide range of experiments performed on the machine since its inception, EBITs have become one of the most successful devices to Produce, trap and study the structure and

Binary Diffusion Coefficients for Combustion Modeling

November 30, 2002
Author(s)
William S. McGivern, Jeffrey A. Manion
Recent studies have demonstrated that combustion models can be as sensitive to the binary diffusion coefficients of the fuel species as to the kinetics of major chemical reactions. We have constructed a reversed-flow chromatographic apparatus for the

Preliminary Concept Trial of the Semi-Automated Paint Containment System

November 30, 2002
Author(s)
Richard J. Norcross
The Carderock Division of the Naval Surface Warfare Center (NSWC-CD) is developing the Automated Paint Application, Containment, and Treatment System (APACTS) to apply anti-corrosive and anti-fouling paints in an environmentally sound manner. NSWCCD

Calibration of Nonreciprocal Radar Systems

November 14, 2002
Author(s)
Lorant A. Muth
The calibration of nonreciprocal radars has been studied extensively. Here we present a robust calibration procedure using Fourier analysis of back-scatter data from a rotating dihedral. We derive a set of nonlinear equations in terms of the Fourier

Calibrating Photoreceiver Response to 110 GHz

November 13, 2002
Author(s)
Tracy S. Clement, Dylan F. Williams, Paul D. Hale, Juanita M. Morgan
We have measured the magnitude and phase responses of a photoreceiver to 110 GHz using a calibrated electro-optic sampling system. The frequency range of the calibration is limited only by our 1 mm coaxial connectors.

Composition standards for III-V semiconductor epitaxial films

November 11, 2002
Author(s)
Kristine A. Bertness, Lawrence H. Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, Marc L. Salit
A program is underway at NIST to establish standard reference materials (SRMs) for the calibration of instruments used to measure the chemical composition of epitaxially grown III-V semiconductor thin films. These SRMs are designed for the calibration of
Displaying 43176 - 43200 of 74506
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