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Displaying 15626 - 15650 of 17286

A Simulation Study of Repeatability and Bias in the CD-SEM

July 1, 2005
Author(s)
John S. Villarrubia, Andras Vladar, Michael T. Postek
Abstract: The ability of a critical dimension scanning electron microscope (CD-SEM) to resolve differences in the widths of two lines depends on the instrument?s measurement repeatability and any sample dependent biases. The dependence of repeatability and

Content-Level Conformance Testing: An Information Mapping Case Study

March 1, 2005
Author(s)
Boonserm Kulvatunyou, Nenad Ivezic, Albert T. Jones
Content-level conformance testing is a key to achieving interoper-able data exchange among applications deployed across collaborating, yet in-dependent enterprises. In this paper, we identify four types of content-level conformance tests to support

Ceiling Jet Flows.

January 1, 2005
Author(s)
D D. Evans
… Mutual Research Corporation, the National Institute of Standards and Technology (NIST), and at other research …

Rotational Spectra of the Diastereomers of Soman

April 1, 2004
Author(s)
R D. Suenram, R S. DaBell, Angela R. Hight Walker, D J. Lavrich, David F. Plusquellic, M W. Ellzy, J M. Lochner, L Cash, J O. Jensen, A C. Samuels
The pure rotational spectrum of the nerve agent Soman has been recorded and assigned using a pulsed molecular beam Fourier transform microwave spectrometer. The spectrum consists of transitions from two different isomers that are likely the [SS] (or [RR])

The NIST Charpy V-Notch Verification Program: Overview and Operating Procedures

September 1, 2003
Author(s)
Christopher N. McCowan, Thomas A. Siewert, D P. Vigliotti
Charpy impact testing is often specified as ,in acceptance test for structural materials, and companies performing acceptance tests are typically required to verify the performance of their impact machine periodically. The procedure for verifying the

Interlaboratory comparison of InGaAsP EX-SITU characterization

January 1, 2003
Author(s)
Alexana Roshko, Kristine A. Bertness
A study to improve the accuracy of ex-situ characterization of InGaAsP materials for optoelectronics is underway. Six InGaAsP thin film specimens, with nominal photoluminescence wavelengths of 1.1, 1.3 and 1.5 mm, have been measured, with X-ray diffraction

IT Security for Industrial Control Systems

February 28, 2002
Author(s)
Joseph Falco, Frederick M. Proctor, Keith A. Stouffer, Albert J. Wavering
… The National Institute of Standards and Technology (NIST) is working to improve the IT …

Upgrades to the NIST/DARPA EUV Reflectometry Facility

December 1, 2001
Author(s)
Charles S. Tarrio, Thomas B. Lucatorto, S Grantham, M B. Squires, Uwe Arp, Lu Deng
… EUV Reflectometry Facility at the National Institute of Standards and Technology. The chamber replaces a much smaller …

BLCC 5.0-01.

April 1, 2001
Author(s)
S Fuller, A S. Boyles
The BLCC5 Building Life-Cycle Cost Program provides economic analysis of projects for which both initial capital costs and future operational costs need to be considered. The program is useful for evaluating the long-term costs and savings of energy and

Aerodynamic Study of a Vane-Cascade Swirl Generator

November 1, 2000
Author(s)
J F. Widmann, S R. Charagundla, Cary Presser
The air flow through a vane-cascade swirl generator is examined both experimentally and numerically to characterize the inlet combustion air flow entering a reference spray combustion facility at NIST. A three-dimensional model is used to simulate the
Displaying 15626 - 15650 of 17286
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