U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 14701 - 14725 of 17286

Creating HAVIC: Heterogeneous Audio Visual Internet Collection

May 21, 2012
Author(s)
Stephanie Strassel, Amanda Morris, Jonathan G. Fiscus, Christopher Caruso, Haejoong Lee, Paul D. Over, James Fiumara, Barbara L. Shaw, Brian Antonishek, Martial Michel
… Linguistic Data Consortium and the National Institute of Standards and Technology are collaborating to create a large, …

An Empirical Study of a Vulnerability Metric Aggregation Method

August 18, 2011
Author(s)
Su Zhang, Xinming Ou, Anoop Singhal, John Homer
Quantifying security risk is an important and yet difficult task in enterprise network risk management, critical for proactive mission assurance. Even though metrics exist for individual vulnerabilities, there is currently no standard way of aggregating

Hyperspectral Imaging and Analysis of Single Erythrocytes

August 12, 2011
Author(s)
Ji Y. Lee, Matthew L. Clarke, Fuyuki Tokumasu, John F. Lesoine, David W. Allen, Robert C. Chang, Maritoni A. Litorja, Jeeseong Hwang
… in single erythrocytes in order to build oxymetric standards in a cellular level and ultimately for in vivo as …

Diode Power Probe Measurements of Wireless Signals

April 15, 2011
Author(s)
Catherine A. Remley, Hugo Gomes, Alejandro Testera, Nuno B. Carvalho, Monica Barciela
A new view of diode power probes is presented is this paper. It is shown analytically, by simulations and with measurements, that calibration procedures for diode power probes should be rethought when measuring new wireless standard type of signals. In

The Role of High-Field Stress in the Negative Bias Temperature Instability

December 1, 2010
Author(s)
Jason P. Campbell, Kin P. Cheung, John S. Suehle, A Oates
In this study, a fast drain current measurement methodology which supports the standard threshold voltage and transconductance extractions associated with the fast dynamic negative-bias temperature instability (NBTI) is presented. Using this methodology

A Focused Chromium Ion Beam

October 21, 2010
Author(s)
Adam V. Steele, Brenton J. Knuffman, Jabez J. McClelland, Jon Orloff
With the goal of expanding the capabilities of focused ion beam microscopy and milling systems, we have demonstrated nanoscale focusing of chromium ions produced in a magneto-optical trap ion source (MOTIS). Neutral chromium atoms are captured into a

Trade Collaboration Systems

August 30, 2010
Author(s)
Peter Denno
… and government agencies. The National Institute of Standards and Technology, (NIST) through collaboration with …

Feature-based Process Planning Based on STEP

December 31, 2009
Author(s)
Thomas R. Kramer, Frederick M. Proctor
This chapter begins by describing characteristics a process planning language should have. Then it discusses the extent to which four process planning languages have these characteristics. The first two of these are STEP standard process planning languages

NIST s Integrated Colony Enumerator (NICE)

August 11, 2009
Author(s)
Matthew L. Clarke, Jeeseong Hwang
Enumeration of bacterial colonies in an agar plate is simple in concept, but automated colony counting is difficult due to variations in colony color, size, shape, contrast, and density, as well as colony overlap. Furthermore, in applications where high
Displaying 14701 - 14725 of 17286
Was this page helpful?