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NIST Authors in Bold

Displaying 2301 - 2325 of 4197

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Robert A. Clary, Michael L. McGlauflin, Eric P. Whitenton, Christopher J. Evans
… (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two … same bullet signature anytime. In this paper, the design, manufacturing technique, testing results, and potential use …

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Christopher J. Evans, Michael L. McGlauflin, Eric P. Whitenton, Robert A. Clary
… (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two … same bullet signature anytime. In this paper, the design, manufacturing technique, testing results, and potential use …

A Welding Cell That Supports Remote Collaboration

September 30, 1999
Author(s)
James D. Gilsinn, William G. Rippey, Joseph A. Falco, Timothy P. Quinn, Robert Russell, Keith A. Stouffer
… the NIST testbed technology and infrastructure for remote manufacturing that has been applied and demonstrated on a …

Information Modeling: From Design to Implementation

September 1, 1999
Author(s)
Yung-Tsun T. Lee
… Today's manufacturing industry greatly relies on computer technology … of quality information models to facilitate an integrated manufacturing environment. How information models are used to …

CAD-Directed Inspection

January 1, 1984
Author(s)
Ted Hopp
… We all know that the manufacturing process has a major impact on product cost, … a responsibility to provide an informed oversight to the manufacturing processes used in the production of its …

Lumped-Element Impedance Standards

June 1, 1998
Author(s)
Dylan F. Williams, Dave K. Walker
We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard's impedance depends not only on the standard itself, but also on probe placement, probe

2024 ECTC Special Session Report: Advancing Metrology for Next-Generation Microelectronics

July 31, 2024
Author(s)
Ran Tao, Benson Chan, Jan Vardaman
… Metrology plays a pivotal role in semiconductor research, manufacturing, packaging and assembly. It is critical to the … material characterization, instrumentation, testing, and manufacturing capabilities are critically needed to drive product innovation and ensure quality, yield, and manufacturing efficiency. As we look into the future of …

Nanomanufacturing Metrology for Cellulosic Nanomaterials: an Update

December 1, 2014
Author(s)
Michael T. Postek
… The development of the metrology and standards for advanced manufacturing of cellulosic nanomaterials (or basically, … have less embodied energy; utilize no catalysts in the manufacturing, are biologically compatible and, come from a …

The Potentials of Helium Ion Microscopy for Semiconductor Process Metrology

February 6, 2008
Author(s)
Michael T. Postek, Andras Vladar
… Semiconductor manufacturing is always looking for more effective ways to monitor and control the manufacturing process. Helium Ion Microscopy (HIM) presents a … (SEM) currently in use in semiconductor research and manufacturing facilities across the world. Due to the very …

National Institute of Standards and Technology - Texas Instruments Industrial Collaboratory Testbed

October 1, 1998
Author(s)
Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec, Thomas E. Wheatley, Samuel N. Jones
… A portion of the mission of the NIST Manufacturing Engineering Laboratory (MEL) is to improve and … Instruments under the auspices of the National Automated Manufacturing Testbed (NAMT) and in collaboration with the … of telepresence microscopy within a large distributed manufacturing facility such as Texas Instruments and between …

Image Sharpness Measurement in Scanning Electron Microscopy - Part I

January 1, 1998
Author(s)
Michael T. Postek, Andras Vladar
… Scanning electron microscopes are routinely used in many manufacturing environments. Fully automated or semiautomated … are used in semiconductor production and other forms of manufacturing where the ability to measure small features …
Displaying 2301 - 2325 of 4197
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