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NIST Authors in Bold

Displaying 1876 - 1900 of 4197

Parallel Kinematic Machine Research at NIST: Past, Present, and Future

September 1, 1998
Author(s)
Albert J. Wavering
… industrial application of parallel kinematic machines in manufacturing is beginning to emerge. The launch of … available hexapod machine tools at the 1994 International Manufacturing Technology Show in Chicago represented the … technology might mean for their operations. As part of the Manufacturing Engineering Laboratory's National Advanced …

Building a Digital Twin of a CNC Machine Tool

December 18, 2024
Author(s)
Deogratias Kibira, Guodong Shao, Rishabh Venketesh, Matthew Triebe
… Developing digital twins for manufacturing applications is challenging due to insufficient … and improve productivity at any control level of a manufacturing organization – from business planning to …

Baseline Tailor

June 26, 2018
Author(s)
Joshua Lubell
… The NIST Engineering Laboratory's Cybersecurity for Smart Manufacturing Systems project used Baseline Tailor to help develop a Cybersecurity Framework profile for the manufacturing environment. This "manufacturing profile" uses guidance from NIST SP 800-53 and …

CIM Framework Experience Report for 1996

September 1, 1997
Author(s)
David W. Flater
… The National Advanced Manufacturing Testbed (NAMT) Framework prototype distributed manufacturing system that serves as a testbed and trial …

Challenges in Metrology for the Semiconductor Industry

March 21, 2005
Author(s)
Stephen Knight, Joaquin (. Martinez
Leading edge Ultra Large Scale Integrated Circuit manufacture is now well into the realm of Nanoelectronics, with some critical dimensions below 40 nm. The pressures on metrology supporting this manufacture are escalating rapidly. In this presentation we

X-ray Metrology for the Semiconductor Industry Tutorial

February 1, 2019
Author(s)
Daniel F. Sunday, Wen-Li Wu, Scott Barton, Regis J. Kline
The semiconductor industry is in need of new, in-line dimensional metrology methods with higher spatial resolution for characterizing their next generation nanodevices. The purpose of this short course is to train the semiconductor industry on the NIST

Report of the 96th National Conference on Weights and Measures (2011) SP1125

December 13, 2011
Author(s)
Linda D. Crown, Tina G. Butcher, Steven E. Cook, Richard A. Harshman, Lisa Warfield, David A. Sefcik
The 96th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 17 to 21, 2011, at the Holiday Inn Downtown at the Park, Missoula, Montana. The theme of the meeting was Educating Today for Tomorrow. Reports by the NCWM Board

Report of the 89th National Conference on Weights and Measures

December 9, 2004
Author(s)
Kenneth S. Butcher, Steven E. Cook, Linda D. Crown, K M. Dresser, H V. Oppermann, R C. Suiter, Juana S. Williams
The 89th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 11 through July 15, 2004, at the Pittsburgh Hilton and Towers in Pittsburgh, PA. The theme of the meeting was, Changes and Opportunities. Reports by the NCWM
Displaying 1876 - 1900 of 4197
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