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Displaying 3951 - 3975 of 4212

Self-Assembled Porphyrinic Materials on Surfaces

October 16, 2008
Author(s)
J Batteas
For the foreseeable future, the vast majority of commercial electronics, photonics, and other devices will be in the solid state and incorporated onto or into a substrate though there are substantial efforts to change this paradigm (1). To date, most of

Power Loading Effects in Precision 1 Ohm Resistors

August 1, 2008
Author(s)
George R. Jones, Randolph E. Elmquist
Five manganin alloy Thomas-type 1 Ohm resistors serve as primary working standards at the National Institute of Standards and Technology (NIST) in the precision potentiometer direct current comparator (DCC) system used for special 1 Ohm customer

Improving the Reliability of VOC Emissions Testing of Building Products

October 1, 2007
Author(s)
Cynthia H. Reed, Andrew K. Persily, Steven J. Nabinger, John C. Little, Steven Cox
Manufacturers of building materials and furnishings are increasingly using emissions chamber testing to demonstrate low volatile organic compound (VOC) emissions from their products and to qualify for low-emitting certification and sustainable labeling

Smart Machining Systems: Issues and Research Trends

November 1, 2005
Author(s)
Laurent Deshayes, Lawrence A. Welsch, Alkan Donmez, Robert W. Ivester, David E. Gilsinn, Richard L. Rhorer, Eric P. Whitenton, Florian Potra
… to changes in demand (just in time); realizing rapid manufacturing; and, providing data on an as needed basis. …

Healthcare Strategic Focus Area: Clinical Informatics

September 1, 2005
Author(s)
Conrad Bock, Lisa Carnahan, Steven J. Fenves, Michael Gruninger, V Kashyap, Bettijoyce B. Lide, Jim G. Nell, Ravi S. Raman, Ram D. Sriram
… interest to NIST?s Information Technology (ITL) and Manufacturing Engineering Laboratories (MEL): ? electronic …

The GOES Time Code Service, 1974 - 2004: A Retrospective

February 27, 2005
Author(s)
Michael A. Lombardi, D. W. Hanson
After nearly 30 years of continuous operation, NIST ended its Geostationary Operational Environmental Satellites (GOES) time code service at 0 hours, 0 minutes Coordinated Universal Time (UTC) on January 1, 2005. This event marked the end of an important

Traceable Pico-Meter Level Step Height Metrology

December 1, 2004
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Joseph Fu, Theodore V. Vorburger
The atomic force microscope (AFM) increasingly being used as a metrology tool in the semiconductor industry where the features measured are at the nanometer level and continue to decrease. Usually the height sensors of the AFM are calibrated using step

Isotopic Metrology of Carbon Dioxide. I. Interlaboratory Comparison and Empirical Modeling of Inlet Equilibration Time, Inlet Pressure, and Ion Source Conductance

June 1, 2003
Author(s)
R M. Verkouteren, C E. Allison, S A. Studley, K J. Leckrone
We report a pilot study of high-precision differential isotopic ratio measurements made on replicate samples of pure carbon dioxide using three instruments of identical manufacture. Measurement protocols were designed to explore the effects of sample size

Energy Consumption Measurements Using AHAM HRF-1 and ISO 8561

March 10, 2003
Author(s)
David A. Yashar
This investigation compares the energy consumption ratings obtained for refrigerators using the Association of Home Appliance Manufacturers (AHAM) HRF-1 test procedure, as adopted by the United States Department of Energy (DOE), and the International

Refrigeration Methods for Superconductors

December 1, 2002
Author(s)
Ray Radebaugh
This chapter reviews various methods commonly used for achieving the cryogenic temperatures required of superconducting materials. The problems associated with cryogenic refrigerators (cryocoolers), such as poor reliability, low efficiency, electromagnetic

Review of Residential Sprinkler Systems: Research and Standards

December 1, 2002
Author(s)
Daniel M. Madrzykowski, R P. Fleming
Automatic sprinkler systems have been successfully used to protect industrial and commercial buildings and their occupants for more than 100 years. Historically, the place which has offered the least amount of fire protection to occupants, was and still is

Triggered Image Capture for High Speed Display Characterization

January 1, 2002
Author(s)
John W. Roberts
¿¿¿Precision display measurements often involve the integration of light measurements over many frames. Newer display technologies with high speed light modulators such as micromirrors are able to make sophisticated use of temporal modulation. This may

The Stability of Nb/Nb 5 Si 3 Microlaminates at High Temperatures

September 1, 2001
Author(s)
D van Heerden, A J. Gavens, P R. Subramanian, Timothy J. Foecke, Timothy P. Weihs
The chemical, phase and microstructural stability of Nb/Nb 5Si 3 microlaminates was investigated at temperatures ranging from 1200 C to 1600 C. The microlamintes were vapor deposited at room temperature and subsequently annealed at 1200 C to crystallize

High Temperature Lead-free Solder for Microelectronics

June 1, 2001
Author(s)
Frank W. Gayle, G Becka, J Badgett, G Whitten, TG Y. Pan, A Grusd, B B. Bauer, R Lathrop, J Slattery, I Anderson, J Foley, D Napp, J D. Mather, C Olson
This paper reports the result of a four-year industrial consortium effort to develop Pb-free solders for high temperature applications (up to 160 degrees c). Work included preliminary evaluation of 32 Sn-based alloys, a screening of the thermomechanical
Displaying 3951 - 3975 of 4212
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