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Displaying 3301 - 3325 of 4212
Wendel Wohlleben, Nathan Bossa, Denise Mitrano, Keana C. K. Scott
… extent in their life cycle, and releases can occur during manufacturing, use and end-of-life. Releases (what is … issues such as tire wear, advanced materials and advanced manufacturing, biodegradable polymers, and non-solid …
Sebastian Engmann, Hyun W. Ro, Andrew A. Herzing, Dean M. DeLongchamp, Chad R. Snyder, Lee J. Richter, Adam J. Barito, David J. Gundlach
… development of processes compatible with high speed manufacturing. Extensive studies of the lab-to-fab challenge … PCE in thick films is critical to solution based scale manufacturing. Extensive device analysis via impedance …
Dean G. Jarrett, Marlin E. Kraft, Isabel Castro, Brett Degler, Mark Evans
The Metrology of the Ohm Project in the Quantum Electrical Metrology Division (QEMD) at the National Institute of Standards and Technology (NIST) routinely disseminates the U. S. representation of the ohm through our calibration services and measurement
Ultrasonic technology is evolving rapidly. It offers prospects for improving flow measurements, for serving as transfer standards, and possibly for serving as a primary flow standard. This paper describes results from several current NIST projects that
Buildings significantly alter the environment. According to Worldwatch Institute (1), building construction consumes 40 percent of the raw stone, gravel, and sand used globally, and sand used globally each year, and 25 percent of the virgin wood. Buildings
Yaw S. Obeng, Kevin J. Coakley, Pavel Kabos, Stephane Moreau
We develop an empirical model for measured frequency-dependent insertion loss (|S21|). The model parameters are determined with a stochastic optimization implementation of the Leven-berg-Marquard method. We compare measured |S21| on TSV-interconnects from