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NIST Authors in Bold

Displaying 2776 - 2800 of 4199

Exploring Registration of Optical, CMM and XCT for Verification of Supplemental Surfaces to Define AM Lattices: Application to Cylindrical and Spherical Surfaces

August 25, 2021
Author(s)
Maxwell Praniewicz, Jason Fox, Gaurav Ameta, Felix Kim, Paul Witherell, Christopher Saldana
… The use of lattice structures produced using additive manufacturing (AM) is of great interest to the aerospace and … tactile measurements of components produced using additive manufacturing and recommends that definition of inspection …

An updated protocol based on CLSI document C37 for preparation of off-the-clot serum from individual units for use alone or to prepare commutable pooled serum reference materials

October 30, 2019
Author(s)
Johanna Camara, Uliana Danilenko, Hubert W. Vesper, Gary L. Myers, Patric A. Clapshaw, W. Greg Miller
Manufacturers of in-vitro diagnostic medical devices, clinical laboratories, research laboratories and calibration laboratories require commutable reference materials that can be used in the calibration hierarchies of medical laboratory measurement

Automated uncertainty quantification analysis using system model and data

October 29, 2015
Author(s)
Saideep Nannapaneni, Sankaran Mahadevan, David Lechevalier, Anantha Narayanan Narayanan, Sudarsan Rachuri
… uncertainty can improve decision-making and, thereby, make manufacturing systems more efficient. Accomplishing all of … statistics, data science, optimization, and, of course, manufacturing. In this paper, we focus on quantifying …

Relationship between CTDI values and measured Peak Skin Dose (PSD)

July 16, 2013
Author(s)
Ronaldo Minniti, Hugo de las Heras Gala, Sean Wilson, Chad Mitchell, Marlene Skopec, Claudia Brunner, Kish Chakrabarti
In this work we relate the CT dose index volume (CTDIvol) readily displayed in all CT units with an actual Peak Skin Dose (PSD) value. Measurements of the CTDI and skin exposure were performed simultaneously using an ionization chamber and radiochromic

Factors Influencing the Smoldering Performance of Polyurethane Foam

September 26, 2012
Author(s)
Mauro Zammarano, Szabolcs Matko, Roland H. Kraemer, Rick D. Davis, Jeffrey W. Gilman, Shivani N. Mehta
The objective of this study was to evaluate whether polyurethane foam (PUF) could be produced as a standard reference material for ultimate use in a standard test intended to ensure the smoldering performance of commercially available upholstered furniture

Lithography, Metrology and Nanomanufacturing

April 12, 2011
Author(s)
James A. Liddle, Gregg M. Gallatin
… Semiconductor chip manufacturing is by far the predominant nanomanufacturing … is expensive, it is a small percentage of the overall manufacturing cost. The level of stability and control …

Optical Properties of Semiconductors

October 19, 2009
Author(s)
David G. Seiler, Stefan Zollner, Alain C. Diebold, Paul Amirtharaj
… Rapid advances in semiconductor manufacturing and associated technologies have increased the …

Information Management Gaps for Board Fabrication and Assembly

September 1, 2009
Author(s)
Eric D. Simmon, Jeff Pettinato
… is an increasing need for 'real-time' or 'near real-time' manufacturing control systems. In addition to being expected to respond to manufacturing needs on almost an instant's notice, there is …

Hashing Techniques for Mobile Device Forensics

June 15, 2009
Author(s)
Richard Ayers, Shira Danker, Rick Mislan
Technological advances found in mobile devices today, equal or exceed that of the computing power present in desktop computers of less than a decade ago. As mobile devices proliferate, techno-logical advances provide users with increased power, range

Neutron Collimation With Microchannel Plates: Calibration of Existing Technology and Near

April 1, 2007
Author(s)
A S. Tremsin, Daniel S. Hussey, David L. Jacobson, Muhammad D. Arif, Robert Gregory Downing, W B. Feller, David F. Mildner
A new type of high performance and compact neutron collimator can be manufactured from Gd- or B-doped microchannel plates (MCPs). Structures only a few mm thick have very narrow rocking curves and high out-of-angle rejection ratios, as observed previously

Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology

January 1, 2007
Author(s)
Michael T. Postek, Andras Vladar, John A. Kramar, L A. Stern, John Notte, Sean McVey
… an approach to measurements for nanotechnology and nano-manufacturing which has several potential advantages over the … (SEM) currently in use in integrated circuit research and manufacturing facilities across the world. Due to the very …

Progress in scale-up of second-generation high-temperature superconductors at SuperPower Inc

March 9, 2005
Author(s)
Y Y. Xie, A Knoll, Y Chen, Y Li, Xiaoxiong Xiong, You-Lin Qiao, P Hou, J Reeves, T Salagaj, K Lenseth, L Civale, B Maiorov, Y Iwasa, V Solovyov, M Suenaga, Najib Cheggour, Cameron C. Clickner, John (Jack) W. Ekin, C Weber, V Selvamanickam
… superconductor (HTS) technology to pilot-scale manufacturing. The emphasis of this program is to develop R&D … to lay the foundation for a framework for large-scale manufacturing. Throughput continues to be increased in all …

Internet-Based Surface Metrology Algorithm Testing System

January 1, 2005
Author(s)
Mark C. Malburg, Jayaraman Raja, Son H. Bui, Thomas Brian Renegar, Bui Son Brian, Theodore V. Vorburger
Software is an integral part of most measurement systems and it is particularly important in roughness measurement and analysis. Evaluation and assessment of measured roughness profiles must be performed in accordance with standards. Different types of

Biomarkers Used to Detect Genetic Damage in Tissue-Engineered Skin

January 1, 2003
Author(s)
C D. O'Connell, Peter E. Barker, M A. Marino, P McAndrew, Donald H. Atha, Pawel Jaruga, M Birincioglu, M. Dizdaroglu, H Rodriguez
… are free of genetic changes that could occur during the manufacturing phase, storage or shipment of the product. In …

Workshop on Fire Testing Measurement Needs: Proceedings

June 19, 2001
Author(s)
William L. Grosshandler
This report describes the proceedings of a workshop held on June 18 and 19, 2001, at NIST in Gaithersburg to identify where science and technology can better prepare fire testing laboratories and their customers to meet these challenges. Topics that were
Displaying 2776 - 2800 of 4199
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