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Displaying 1926 - 1950 of 4635

Demineralizing Effect of Dental Cements on Human Dentin

November 1, 1998
Author(s)
Y Shimada, Y Kondo, S Inokoshi, J Tagami, Joseph M. Antonucci
… confocal laser scanning microscopy after use of an argon-ion etching technique. To determine the surface effects of … argon ion etching, conforcal laser scanning microscopy, …

Designing Neutral-Atom Nanotraps With Integrated Optical Waveguides

April 1, 2002
Author(s)
J P. Burke, S G. Chu, Garnett W. Bryant, Carl J. Williams, Paul S. Julienne
… a potential minimum above the guide. A one-color surface trap proposal uses blue-detuned light and the attractive … guides. We find that all three approaches can be used to trap atoms in two- or three-dimensions with a few 10's of mW …

Flat-Phase Loading of a Bose-Einstein Condensate into an Optical Lattice

November 1, 2002
Author(s)
S E. Sklarz, I Friedler, D J. Tannor, Y B. Band, Carl J. Williams
… of this effect is possible by adjusting the harmonic trap force-constant of the magnetic trap appropriately, thereby facilitating quick loading of an … theory is developed for a non-stationary BEC in a harmonic trap. …

Elucidating Cathode Degradation Mechanisms in NMC811/Graphite Cells Under Fast Charge Rates Using Operando Synchrotron Characterization

February 17, 2022
Author(s)
Cherno Jaye, Daniel A. Fischer, Calvin Quilty, Patrick West, Garrett Wheeler, Lisa Housel, Christoph Kern, Killian Tallman, Lu Ma, Steven Ehrlich, Kenneth Takeuchi, David Bock, Amy Marschilok, Esther Takeuchi
… Li-ion batteries capable of extreme fast charging (XFC) are in … Energy, Li-ion, Batteries, Capacity fading mechanisms, NMC, Operando …

The NIST EUV facility for advanced photoresist qualification using the witness-sample test

August 29, 2011
Author(s)
Steven E. Grantham, Charles S. Tarrio, Shannon B. Hill, Lee J. Richter, J. van Dijk, C. Kaya, N. Harned, R. Hoefnagels, M. Silova, J. Steinhoff
Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be qualified to ensure that they will not excessively contaminate the scanner optics or other parts of the vacuum environment of the scanner. At the National Institute of
Displaying 1926 - 1950 of 4635
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