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Displaying 2276 - 2300 of 2975

Standard Reference Materials--the First Century

January 1, 2003
Author(s)
S D. Rasberry
Over the course of its first one hundred years, the National Institute of Standards and Technology (NIST) has made numerous contributions to advancing the science and practice of measurements. Contributions to fundamental constants and reference data, such

Measured cross sections and ion energies for a CHF 3 discharge.

August 1, 2002
Author(s)
B. Peko, R. Champion, MVVS. Rao, James K. Olthoff
Trifluoromenthane (CHF 3) is used in semiconductor plasma processing chambers to achieve high etch selectivity of an oxide layer over a silicon substrate. Such surface etching is governed by the ion and molecule fluxes near the surface, the concentrations

Special Issue - Crystallography at NIST/NBS

December 1, 2001
Author(s)
Alan D. Mighell, Winnie K. Wong-Ng
The Centennial Celebration of the National Institute of Standards and Technology (NIST), formerly known as the National Bureau of Standards (NBS), takes place in the year 2001. NIST has a long history (> 50 years) of crystallographic research, and has made

Single Molecule Probes

August 1, 2001
Author(s)
Lori S. Goldner, K D. Weston, W F. Heinz, Jeeseong Hwang, E S. DeJong, John P. Marino
The technology to rapidly manipulate and screen individual molecules lies at the frontier of measurement science and impacts emerging bio- and nano-technologies. Fundamental biological and chemical processes can now be probed with unprecedented detail, one

The Application of High-Speed CNC Machining to Prototype Production

June 1, 2001
Author(s)
Tony L. Schmitz, Matthew A. Davies, Brian S. Dutterer, J C. Ziegert
To reduce delays in the design and manufacture of a new part, rapid prototyping is often employed to minimize lead times. In this paper, the application of high-speed machining to the production of monolithic, metallic, functional prototypes is discussed

On-Wafer Measurement of Transmission Lines On Lossy Silicon Substrates

September 25, 2000
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
This paper examines broadband measurement techniques for electrical properties of planar transmission lines built on lossy silicon substrates. We start by investigating the performance of a new formulation of the calibration com-parison method which is

Surveying Through Solid Walls

June 8, 1997
Author(s)
William C. Stone
A good metrology system in the automated environment must (1) measure the three dimensional position and attitude of any component to a reasonable degree of accuracy; (2) acquire these data fairly rapidly; and (3) be capable of making reliable measurements

NIST Neutron Source Pre-Conceptual Design

February 10, 2025
Author(s)
David Diamond, Abdullah Weiss, Osman Celikten, Jeremy Cook, Dagistan Sahin, Hubert King, Anil Gurgen, Joy Shen
A pre-conceptual design has been completed for a NIST Neutron Source (NNS). It would replace the existing facility at the NIST Center for Neutron Research (NCNR) to enable significantly more thermal and cold neutrons to be used in many more experiments

Report on High Energy Arc Fault Experiments: Experimental Results from Medium Voltage Electrical Enclosures

November 29, 2021
Author(s)
Gabriel Taylor, Anthony D. Putorti Jr., Scott Bareham, Edward Hnetkovsky, Kenneth Hamburger, Nicholas Melly, Mark Henry Salley, Christopher U. Brown, Wai Cheong Tam, Eric Link, Michael Selepak, Philip Deardorff, Kenneth Miller, Paul Clem, Byron Demosthenous, Austin Glover, Chris LaFleur, Raymond Martinez, Anthony Tanbakuchi
This report documents an experimental program designed to investigate High Energy Arcing Fault (HEAF) phenomena for medium voltage electrical switchgear containing aluminum conductors. This report covers full-scale laboratory experiments using

Setting Kinetics of Calcium Phosphate Cement by Dielectric Spectroscopy

October 16, 2008
Author(s)
H J. Mueller, R W. Hirthe
Calcium phosphate cements (CPC) are useful because of their excellent biocompatibility and self-hardening behavior. The setting reaction involving equimolar quantities of tetracalcium phosphate (TTCP, Ca4(PO4)2O) and dicaalcium phosphate anhydrous (DCPA

Workshop on Reliability Issues in Nanomaterials

August 1, 2005
Author(s)
Robert Keller, David T. Read, Roop L. Mahajan
The Workshop on Reliability Issues in Nanomaterials was held at the Boulder Laboratories of the National Institute of Standards and Technology (NIST) on August 17-19, 2004. It was designed to promote a particular subset of NIST?s responsibilities under the

Two-dimensional imaging of electromagnetic fields via light sheet fluorescence imaging with Rydberg atoms

November 24, 2025
Author(s)
Noah Schlossberger, Tate McDonald, Kevin Su, Rajavardhan Talashila, Robert Behary, Charles L. Patrick, Eugeniy E. Mikhailov, Seth Aubin, Irena Nokivoka, Christopher Holloway, Nikunjkumar Prajapati
Imaging of electric and magnetic fields is limited by the fact that conventional field probes rely on conductive elements that perturb the fields they are meant to measure and require either spatial scanning or arrays to produce field maps. Atomic sensors
Displaying 2276 - 2300 of 2975
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