January 8, 2014
Author(s)
Xiaoyu Alan Zheng, Johannes A. Soons, Theodore V. Vorburger, Jun-Feng Song, Thomas Brian Renegar, Robert M. Thompson
Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. In 2009, a report by the National Academies called into question, amongst others